A Revolution in the Economics of Image Sensor Test!

The Teradyne IP Test System Series offers the Best Test Economics with shorter test time, higher parallelism (to significantly increase throughput), and lower capital cost.

If you’re looking for a complete image sensor test solution, contact the nearest Teradyne office to find out about the great savings Teradyne’s IP Test Systems can offer you.

 

The IP750EP offers External Triggering to make image capture even easier.

 

IP750 Series Features:

High Throughput

Up to 16-site parallel testing – the world’s highest image sensor parallel test capability available today.

 

Covering a Broad Range of Devices up to 16M Pixels

High versatility for testing a broad range of devices – up to 16M Pixels simultaneously at each site.

 

Single Platform

Built with Teradyne’s J750 VLSI test platform (over 1,700 systems installed worldwide) – IP750 series systems can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market

 

IG-XL Software: Fast Program Development with Common System Software Environment

IG-XL™ software environment, built using Windows® Excel, provides a user-friendly interface for fast program development. IG-XL software enables easy upgrade of test programs from single to multi-site, dramatically reducing the workload of test engineers on mass production launches. IG-XL sotware is the common software environment for the IP750 series, the IP600, and the FLEX™ Test Platform, eliminating the need for training test engineers for software programming on separate testers.

 

IP750/IDP Library

Utilizing an IDP (Image Data Processing) library with a wide range of data processing techniques developed by the IP750, making test programming easier than ever before.

 

High Reliability with Worldwide Support

Teradyne Japan Division developed the IP750 Series based on the highly reliable J750 test platform. For over 20 years, Teradyne has ensured its customers high quality performance and worldwide support based on its experience in research and development, manufacturing, and customer support, and its expertise with image sensor testing.

 

IP750 Key Features Provide a Total Solution

Improved Data Transfer Speed

Using an optical fiber cable to replace the IEEE1394 enables massive data transfer at higher speed, achieving a significant reduction in test time for image sensors.

 

Automated Test Time Optimizer: TTO

Image testing involves carrying out three processes: image capture, image transfer, and image processing. Faster test time requires these processes to be carried out simultaneously, posing great challenges to even skilled test engineers. The IP750EP offers the Test Time Optimizer (TTO), which optimizes the image capture and image processing flow automatically, without the need for intervention by skilled engineers. Automated TTO reduces test time and test program development time while enabling customers to achieve quick test development with higher throughput.

 

New Wide Area Illuminator

The IP750EP offers an advanced internal illuminator (ITOS-750A) with a 110mm diameter, and a 77mm x 77mm square or 100mm x 45mm rectangular illumination area, the largest coverage area available, making 8 site /16 site parallel testing possible.

 

Low Capital Cost

IP750EP reduces capital cost while achieving great improvements in performance through continuous innovation.

 

IP750EMP for Shorter Test Time

With a multiple-PC architecture (IP750EMP), image data processing (IDP) for multiple sites can be done individually but simultaneously, providing a flexible solution for the needs of large IDP device testing.