Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications. |
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Japan Division
Japan Division (JD) was established in 1984 as Teradyne's first overseas division aiming to customization, design, marketing, and manufacturing of semiconductor ATE to provide quick response to our Japanese customers' needs. JD has been delivering the best test solution through a combination of Teradyne US advanced technology and local design engineering and manufacturing. Japan Division develops and manufactures its original products to test semiconductor devices for the technology areas where Japan is a global leader, and markets to overseas customers through Teradyne's world-wide sales and support network. Japan Division has almost 20 years of experience in image sensor testing and has been the global market leader in image sensor test systems. The IP750 CCD/CMOS image sensor test system was developed by JD in 2000. Over 200 systems have shipped to date.
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Test Products