 Teradyne’s
Ai-760 is a breakthrough analog test instrumentation
subsystem for C-size VXI test environments. The Ai-760
allows systems integrators to construct more advanced
mixed-signal test equipment based on Teradyne’s
Core System Instrumentation (CSi) architecture, achieve
higher levels of functionality, and attain superior
performance in a much smaller form factor.
 With
parallel source and measure capability for faster test
program set throughput, the Ai-760 is perfect for high-speed
and high-performance functional/operational analog testing.
The Ai-760 offers higher fidelity tester-per-pin performance
and packs more functionality in a single VXI slot than
most large-frame test stations. Its superior specifications
and functional density enables system integrators to
reduce test assets, consolidate VXI slots, and scale
down the test solution footprint. The Ai-760’s
system-per-pin architecture facilitates parallel testing
, reduces test run times, and increases fault coverage
by more accurately emulating complete system-level operation.
A single VXI-compliant C-size Ai-760 card provides up
to 16 high-performance I/O channels.
KEY FEATURES
- High performance analog test
- High density provides up to 48 instruments in a
single slot to dramatically reduce test system throughput
- Tester-per-pin architecture enables accurate emulation
of system-level operation to improve test quality
- Parallel test capability reduces test execution
time by up to 90%
- Two configurations feature up to 16 timer/counter,
digitizer, and ARB channels; and up to two DMM and
digital sampling oscilloscopes in a single VXI slot
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