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Ai-760 Analog Test Instrumentation Subsystem
 

CSiTeradyne’s Ai-760 is a breakthrough analog test instrumentation subsystem for C-size VXI test environments. The Ai-760 allows systems integrators to construct more advanced mixed-signal test equipment based on Teradyne’s Core System Instrumentation (CSi) architecture, achieve higher levels of functionality, and attain superior performance in a much smaller form factor.

Click on the image to enlargeWith parallel source and measure capability for faster test program set throughput, the Ai-760 is perfect for high-speed and high-performance functional/operational analog testing. The Ai-760 offers higher fidelity tester-per-pin performance and packs more functionality in a single VXI slot than most large-frame test stations. Its superior specifications and functional density enables system integrators to reduce test assets, consolidate VXI slots, and scale down the test solution footprint. The Ai-760’s system-per-pin architecture facilitates parallel testing , reduces test run times, and increases fault coverage by more accurately emulating complete system-level operation. A single VXI-compliant C-size Ai-760 card provides up to 16 high-performance I/O channels.

KEY FEATURES

  • High performance analog test
  • High density provides up to 48 instruments in a single slot to dramatically reduce test system throughput
  • Tester-per-pin architecture enables accurate emulation of system-level operation to improve test quality
  • Parallel test capability reduces test execution time by up to 90%
  • Two configurations feature up to 16 timer/counter, digitizer, and ARB channels; and up to two DMM and digital sampling oscilloscopes in a single VXI slot

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