 Versatile C-size VXI Instrument for Defense and Aerospace applications
Teradyne’s Ai-760 analog test instrument allows systems integrators to create powerful, mixed-signal test equipment that yields lower costs for test systems and test programs. The Ai-760 is a standards-based analog test solution that provides high-performance and flexibility for Defense and Aerospace test applications. The Ai-760 combines legacy functionality with advanced, parallel test capabilities.
This powerful combination of features
makes the Ai-760 the ideal analog test instrument to leverage past test program set (TPS) investment as well as capture the benefits of operational test..
 As with all instruments in Teradyne’s Core Systems Instrumentation (CSi) family, the Ai-760 combines greater levels of functionality and high-performance in a small form factor. The Ai-760 consolidates moderate frequency source and measurement instruments and provides
solid coordination of analog subsystem
test functions. With parallel source and measure capability to implement operational test of units under test (UUTs) and to increase TPS throughput, the Ai-760 is perfect for reducing test costs while increasing test coverage. This combination of functional density and unified control of multiple instruments enables system integrators to decrease tester footprint and
increase test performance.
KEY FEATURES
- Physical Consolidation of traditional instruments into a single system with increased functionality and decreased footprint
- Complete Analog Subsystem with
Multi function Analog (MFA) Channels
that increases system capabilities while
lowering system operating costs and TPS
development costs
- Parallel Test capability that facilitates
operational test for higher throughput
and quality of test
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