Versatile C-size VXI test instruments for military and aerospace applications

Teradyne’s Di-Series of digital test instruments pack the industry’s most powerful combination of performance, density, flexibility, and usability into a highly integrated, standards-based C-size VXI solution. The Di-Series is equipped to increase functionality and reduce the total number of instruments needed by a test system — thereby decreasing its user complexity, footprint, programming, support and cost-of-ownership.

As part of Teradyne’s Core System Instrumentation (CSi) portfolio, the Di-Series is interoperable with other instruments, including our legacy M9-Series. VXI system integrators can use the Di-Series to build and customize highly functional test platforms and satisfy the many requirements common to military and avionics test equipment. The Di-Series features the key elements needed to test all levels of integration from SRU to LRU. Di-Series has already been selected for use in ARGS (Advanced Concept Technology Demonstration) as well as the B-1 Advanced Digital Test System.

KEY FEATURES

• Total Teradyne Compatibility — maintains TPS investment with previous generations of Teradyne digital instrumentation and systems.
• LRU-Centric Flexibility — addresses diverse requirements; UUTs from boards to boxes, old and new designs, and legacy instrument replacement.
• Unmatched Performance — addresses the latest technology and provides the best quality of test.
• Breakthrough Usability — provided by flexible hardware and innovative development/debugging software.

For additional information:

• Di-Series Product data sheet
• Di-Series AUTOTESTCON 2005 posters