The M9-Series of digital test instruments provide instruments for high-performance digital testing for C-size VXI-based subsystems. Digital functional test capabilities represent fifth-generation Teradyne technology. With a VXI plug & play software driver and hardware that are compliant with VXI interface standards, M9-Series instruments are easily integrated with other instruments in VXI-based test systems.

Proven techniques for fault detection and diagnosis offer higher accuracy and better resolution than other implementations, preventing repair loops and minimizing repair time. M9-Series diagnostics includes boundary-scan diagnostics, an intelligent guided probe algorithm to trace faults back to the failing electrical node, high-resolution fault-dictionary and integrated guided-probe, and fault-dictionary diagnostics to provide maximum resolution with a minimum number of probe points. The software includes links to industry standard test development tools like LASAR and VICTORY.

Teradyne’s digital hardware is currently in use in the Navy’s CASS and RTCASS systems, the Army’s IFTE EOTF system, the Air Force’s IFTE CEE and F16 CIATE systems as well as the Marine Corps’ TETS system. It is a critical component of the Spectrum 9000-Series in supporting USAF Intermediate and Depot Level Programs for the C-17, A10, F16 and F22 programs.

M9-Series – “Best in Class” digital test capability:

• Speed – 50MHz across all channels
• Accuracy – precise timing resolution
• Density – up to 64 channels per card slot
• Repeatability – maintains accuracy from system-to-system
• Flexibility – adapts to any TPS development environment
• Reliability – Max uptime high MTBF, low MTTR

For additional information:

• M9-Series of VXI Digital Test Instruments

To learn more about the M9-Series, please visit M9-Series FAQs.