| 1. |
How can I test bus-structured digital electronics to ensure that the units will function in the final system? |
| 2. |
What is the basic difference between a digital-test instrument and a digital-word generator? |
| 3. |
How do I program a digital test instrument? |
| 4. |
Once I detect a failure, how can I troubleshoot it with the M9-Series instrument? |
| 5. |
How can I test bus-structured digital electronics to ensure that the units will function in the final system? |
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| 1. |
How can I test bus-structured digital electronics to ensure that the units will function in the final system? |
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The M9-Series VXI digital test instruments accurately emulate complex digital signals, including digital buses. The M9-Series ensure reliable high-fault-coverage functional tests. Features include up to 256 timing sets with 4-drive phases and 4-test windows that are fully programmable, selectable per pin, and switchable on-the-fly. Flexible timing features make it easy to map simulation results, bus specifications, or Unit Under Test (UUT) requirements to M9-Series test patterns. Absolute accuracy is specified across all pins using a proven, time-domain reflectometry technique that actively measures and removes channel-to-channel delay. Dual-threshold voltage detection guarantees that the UUT meets voltage-level specifications, ensuring that the tested unit can adequately drive the other devices in the system. |
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| 2. |
What is the basic difference between a digital-test instrument and a digital-word generator? |
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The main difference is flexibility. A digital-word generator releases batched data at a fixed rate, meaning that the data coming from the instrument can only change at the selected frequency. A performance digital-test instrument has greater flexible timing, which allows the programmer to delay data from the programmed edge and format data. The use of phase generators creates finer control over signal activity and allows the user to create timing sets that accurately reflect "data book" timing for bus structured devices. In addition, a digital test instrument allows the frequency at which the data is applied to vary from timing set to timing set on-the-fly |
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| 3. |
How do I program a digital test instrument? |
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The best way to create complex digital test programs is via a simulator. Teradyne's LASAR simulator predicts Unit Under Test (UUT) response to programmed stimulus. It also evaluates the fault coverage of the test patterns and provides tools to assist the developer in improving the quality of the test program. The LASAR simulator allows the test programmer to simulate not only the UUT, but also the tester environment by creating a simulation that accurately reflects the operation of the UUT within the tester environment. Once the simulation is complete the results can be post processed to IEEE-1445 Digital Test Interchange Format and then readily imported to the M9-series test instrument via the LSRTAP importer provided with the M9-series VXIplug & play driver.
The M9-Series can also be programmed at the register level, allowing a programmer to use the M9-Series digital test instrument to replace aging digital test systems without modifying existing test programs. The M9-Series supports Serial Vector Format via an importer that allows the M9-Series to run 1149.1 boundary scan tests. |
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| 4. |
Once I detect a failure, how can I troubleshoot it with the M9-Series instrument? |
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The M9-Series has optional diagnostic software that automatically isolates a test failure. The guided probe and fault dictionary algorithms most often use the output of a simulator, like LASAR, to generate the required data for fault detection. The fault dictionary takes the fault signature of a bad device and compares it to fault signatures generated during fault simulation. The result is a list of most likely failures with a match value that indicates the probability that the call out is correct. The guided probe algorithm then compares nodal data from the failing unit to a database with known good nodal data. The software traces back from a failing output to faulty node, guiding the operator until the faulty node is isolated. |
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| 5. |
How can I test bus-structured digital electronics to ensure that the units will function in the final system? |
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The M9-Series VXI digital test instruments accurately emulate complex digital signals, including digital buses. The M9-Series ensure reliable high-fault-coverage functional tests. Features include up to 256 timing sets with 4-drive phases and 4-test windows that are fully programmable, selectable per pin, and switchable on-the-fly. Flexible timing features make it easy to map simulation results, bus specifications, or Unit Under Test (UUT) requirements to M9-Series test patterns. Absolute accuracy is specified across all pins using a proven, time-domain reflectometry technique that actively measures and removes channel-to-channel delay. Dual-threshold voltage detection guarantees that the UUT meets voltage-level specifications, ensuring that the tested unit can adequately drive the other devices in the system. |
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