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In the News
 
Title Date Format Size
"Testing Multi-Functional Power Managment ICs"
Semiconductor International, by Tom Chambers
June 2009 PDF 345kb
"Testing DigRF for 3G Handsets"
Test & Measurement World, by Ed Seng
May 2009 PDF 351kb
What is Concurrent Test?"
Evaluation Engineering, by John Yost
April 2009 PDF 193kb
"Testing WiMedia UWB"
Test & Measurement World, by Mike Carr
Febraury 2009 PDF 185kb
"Tackling Next-Generation RF SOC Test "
Evaluation Engineering, by Ron Burke
October 2008 PDF 909kb
"Enabling Seamless WiMAX Fabric"
Test & Measurement World
May 2008    
"Laying Seamless WiMAX Fabric"
EDN
May 2008    
"Next Generation RFIC & RFSOC Test Challenges"
Evaluation Engineering, by Ken Harvey
October - December 2007 PDF 1.2MB
"From potential energy to value added by test"
Test & Measurment World, Dr. Fang Xu
September 2007    
"The backstory on backdriving"
Test & Measurment World, By Anthony Suto & John McNeill
September 2007 pdf 132Kb
"Test & Measurement World" July 2007    
Adding AXI to a PCBA Test Process April 2007 .cfm  
Nepcon Shanghai News April 2007 .cfm  
IEEE Instrumentation & Measurement magazine February 2007 pdf 521Kb
Comparing costs and ROI of AOI and AXI Peter Edelstein, Teradyne, North Reading, MA, USA February 2007 .html  
"More Versatile X-Ray Inspection"
Test & Measurment World, Paul Groome
November 2006 pdf 1.07Mb
"To Mux or not to Mux"
Test & Measurment World, Alan Albee & Anthony Suto
November 2006 pdf 235Kb
"Evaluating ROI of AXI vs. an AOI"
Circuit Assembly, Keith Fairchild
October 2006 pdf 684Kb
"The Selection and Economics of Wireless Test Fixtures"
Evaluation Engineering, Michael J. Smith
September 2006 pdf 991Kb
"Multisite Test Strategy for SIP Mobile Technologies"
Evaluation Engineering, Jim McEleney and Randy Kramer
July 2006    
"Designing PCBs for Test & Inspection"
On-Board Magazine, Michael J. Smith
June 2006 pdf 268Kb
 
     
 
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