ABOUT THE SEMINARS
This seminar series is comprised of three parts. Each part will be presented twice to accommodate our worldwide audience. Before you register, please note the Class ID for the seminar(s) you want to attend. The expected duration for each seminar is about one hour.

NOTE: Register for one, two, or all three seminars in this series. While participation in all three will provide the most comprehensive, in-depth perspective on the benefits of OptimalTest’s technology and solutions, each seminar is also a stand-alone tutorial.

Part 1: Innovations in Test Optimization - Yield, Quality, Reliability & OEE (USA-12640 and USA-12641)
Part 1 is an introduction to OptimalTest (OT) solutions with a description of the IT backbone and real-time and near-time solutions with a brief demo. There will also be an overview of the advanced adaptive test methodologies, including test time reduction (TTR) and outlier detection algorithms. There will be a Q&A session at the end of the seminar.

Part 2: Advanced Adaptive Test & Business Support Tools for Test (USA-12642 and USA-12643)
Part 2 will review the OT solutions portfolio and describe advanced adaptive testing, its real-time test cell control benefits, baseline die, and data feed forward/feedbackward for quality and efficiency. The OT-Dashboard will also be discussed, including how to use it as a business decision support tool and how to create a dashboard. There will be a Q&A session at the end of the seminar.

Part 3: Case Study - A Leading Fabless and Its Supply Chain (USA-12644 and USA-12645)
Part 3 will set up the case study and describe the results which will include yield ramp, yield recovery, outlier equipment detection, outlier detection for quality, and TTR. After the results have been determined, there will be a review of the ROI. There will be a Q&A session at the end of the seminar.

ABOUT THE PRESENTERS
Debbora Ahlgren, Vice President Sales and Marketing, OptimalTest
Gil Balog, Vice President Product and Test Engineering, OptimalTest
Julia DiChiaro, TAG Tools & IP Leader, Teradyne

DATES AND TIMES
Part 1: July 21/22, 2009
Part 2: July 28/29, 2009
Part 3: August 4/5, 2009

Part 1	Session 1
Class ID	USA-12640
Date/Time	Tuesday, July 21 at 10 a.m. Boston Time Same as: Tuesday, July 21 at 4 p.m. Paris Time or 7 a.m. California Time
Part 1	Session 2
Class ID	USA-12641
Date/Time	Wednesday, July 22 at 10 a.m. Singapore Time Same as: Tuesday, July 21 at 7 p.m. California Time

Part 2	Session 1
Class ID	USA-12642
Date/Time	Tuesday, July 28 at 10 a.m. Boston Time Same as: Tuesday, July 28 at 4 p.m. Paris Time or 7 a.m. California Time
Part 2	Session 2
Class ID	USA-12643
Date/Time	Wednesday, July 29 at 10 a.m. Singapore Time Same as: Tuesday, July 28 at 7 p.m. California Time

Part 3	Session 1
Class ID	USA-12644
Date/Time	Tuesday, August 4 at 10 a.m. Boston Time Same as: Tuesday, August 4 at 4 p.m. Paris Time or 7 a.m. California Time
Part 3	Session 2
Class ID	USA-12645
Date/Time	Wednesday, August 5 at 10 a.m. Singapore Time Same as: Tuesday, August 4 at 7 p.m. California Time

HOW TO REGISTER
There is no fee to attend this seminar. To register, contact Teradyne Customer Training Registration:

By Phone: Dial 1-800-TERADYNE (Canada and USA) or click the Contact Customer Care button at http://support.teradyne.com for local contact information.

Over the Web: Register for Semiconductor Test Training (www.teradyne.com > Training > Semiconductor Test > Computer-Based Classes). Click the Class ID or Enroll icon to register for the session you want to attend.

By Email: CustomerTraining@teradyne.com

Questions?
Email WebSeminars@teradyne.com