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Suggested topics for TUG 2010 are listed below. However, we will accept abstracts for any topic that is relevant to Teradyne products and our industry.
Defense & Aerospace Program | Semiconductor Test Program
Download TUG 2010 Hot Topics
Defense & Aerospace Program (top)
- ATLAS Integration
- Enhancing existing tests with new instrument capabilities
- Mixed signal testing with the Ai-760 and Di-Series
- Parallel/Operational test with the Ai-7 series
- Sending and receiving data with the Di-Series
- Spectrum 9100-Series M9-Series to Di-Series migration
- System characterization for instrument replacement
- Techniques for new Di-Series TPS development
- Testing unique busses using the Bi4-Series
- Writing a CEM for the Ai-760
Semiconductor Test Programs (top)
- 4G cellular
- Adaptive test flows
- Characterizing DIB designs
- Code reuse
- Collaborating between groups on test development
- Concurrent test techniques
- Continuity methodologies; tips and tricks
- Controlling calibration: EEPROM usage, disabling channels, etc.
- DUT board considerations for highly parallel test
- Embedded controller testing challenges
- Gen4 to UltraWave conversion experience
- Gigabit-per-second digital signals: practical issues using them
- High parallel test
- High speed serial memory tests
- Higher speed test with the TAC card
- How do you use scan pattern failure data?
- How to test multi-core processors: concurrent test and time domains
- Iddq testing
- Integration of ESA into test programs
- Jitter measurement techniques
- Low DPPM FLASH testing challenges
- LTE device testing
- MEMS device testing
- Multisite power testing
- Protocol Aware ATE
- Reduced pin count test
- Reducing test cost
- Reducing test program development time
- RF wafer probe
- Rise and fall time characterization for digital inputs
- Software tools for improved test development productivity
- Simulation of the DUT signal path for ultra-high performance DIB design
- Stress testing
- SMPS test techniques
- Test economics
- Test IP reuse
- Test optimization
- Test program architecture to facilitate code reuse and program modularity
- Testing LTE devices
- User software extensions to IG-XL
- Using IG-XL V7.10.00 characterization features
- Ultra-high speed test
- What are the boundaries of multisite testing?
- Yield learning and diagnostics
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