TUG 2010 Program Download Program (pdf) Monday | Tuesday | Wednesday Sunday, May 2, 2010 4-6 p.m. Conference Check-In 4-6 p.m. Welcome Reception

Monday, May 3, 2010 7:30 a.m. Breakfast 8:30 a.m. Welcome 9 a.m. Keynote Address 10 a.m. Break 10:30 a.m. Morning Sessions 12 noon Lunch 1 p.m. Afternoon Sessions 2:30 p.m. Break 6:00 PM Teradyne Party

Tuesday, May 4, 2010 7:30 a.m. Breakfast 9 a.m. Morning Sessions 10 a.m. Break 12 noon Lunch 1 p.m. Afternoon Sessions 2:30 p.m. Break 3 p.m. Teradyne Updates 4:30 p.m. Roundtables and Posters

Wednesday, May 5, 2010 7:30 a.m. Breakfast 8:30 a.m. Morning Sessions 10 a.m. Break 12 noon Lunch 1 p.m. Afternoon Sessions

Full abstracts are available. Click a title to view the abstract.
Monday Morning Sessions (top)
	TEST INFRASTRUCTURE AND PRODUCTION	MIXED SIGNAL	RF WIRELESS	DIGITAL	POWER AUTOMOTIVE	ASSEMBLY TEST DEFENSE & AEROSPACE
10:00	Break
	Front Nine			Now the Testing Starts	Test Techniques	Analog
10:30	1A Block-Based Test Methodology on the Nextest Magnum Using Excel (16)	1A How to Test ADCs with Sample Rates Greater Than 100 MSPS on the FLEX (43)	1A UltraWave Receiver Modes (What is “Normal,” Anyway?) (3)	1A Memory Controller Test Using Protocol Aware Test Methodologies (7)	1A Regulator Testing…No Supplies, No Problem! (116)	1A Averaging in the Ai-760 DSO (113)
11:00	1B Using Dynloader for Debugging (119)	1B How to Extend the Voltage Range of HSD200 (27)	1B How to Improve Intermodulation Test Practices (71)	1B GUI Pin Margin Tool (79)	1B How to Trim Temperature Coefficients with DLT (12)	1B Simulating Basic Semiconductor Testing and Curve Tracing Using the Ai-760 or Ai-710 (135)
11:30	1C Script Engine for Nextest Family of Testers (89)	1C Low-voltage Measurements: How Low is Low? (52)	1C Test Time Reduction Method for Testing I/Q Driven Tx 1 dB Compression Tests (4)	1C Compensating for DC Voltage Drop in Production (60)		1C Prioritizing Ai-710 Rehost Candidates through ATLAS Source Code Analysis (136)
12:00	Lunch
Monday Afternoon Sessions (top)
	Irons			Large Site Count Tests	Test Techniques – Eagle	Digital
1:00	2A Set Up an Apache SVN Server to Bring Revision Control and Test Program Management to your Organization (112)	2A WORKSHOP 1-2:30: Understanding Multisite Variables (46)	2A WORKSHOP 1-2: How to Use the ESA Toolkit for Modulation and Demodulation Testing (58)	2A Modeling Test Economics for High Site Count Parallel Test (2)	2A Benefits of Floating Resources (1)	2A Using the Bi4-Series to Test a Custom Manchester Encoded Serial Data Bus (54)
1:30	2B Test Documentation Generation in HTML Out of Comments in the Program Code and a Datalog (13)			2B High Channel Count External Instrument Integration with J750 (41)	2B How to Measure Fast Rise/Fall Times on an Eagle Tester: Comparator to Convert to Prop Delay (93)	2B Di as a Serial Interface (137)
2:00	2C Advanced Platform Concept for Team Collaboration (95)		2C WiMAX RF Testing with the ESA (44)	2C HPT on the J750 for More Than 32 Sites: Best Practices (83)	2C Digital Threshold Testing (66)	2C Diagnosing Timing Issues in Di-Series Test Programs (115)
2:30	Break
	On the Green			High-Speed Protocol	Test Quality	Digital Runtime Workshop
3:00	3A Standardizing Characterization Method with IG-XL Characterization API (61)	3A What's Shakin'? An Introduction to MEMS Test (99)	3A Test Method of GSM Modulation and Demodulation Performance by UltraFLEX (129)	3A How to Characterize Random, Data-Dependent, and Periodic Jitter and Rise Time, Fall Time and Other Parametrics Using the GigaDig for Digital Outputs Up to 12.8Gbps (84)	3A New Repeatability and Reproducibility Methodology for Semiconductor Testing (101)	3A WORKSHOP 3-5: Digital Runtime Workshop (hands on) (148)
3:30	3B Using IG-XL with a PXI-Based Hardware Setup (38)	3B MEMS Test Challenges (100)	3B WORKSHOP 3:30-5: How to Compensate for the IQ Baseband Signal Impairment for EVM Test (114)	3B Test Techniques and a Solution for the Embedded DisplayPort Main Link (20)	3B Who Shot GRR on the Road to Release? (109)
4:00	3C IG-XL Runtime Toolkit – A New Tool from Teradyne’s Test Assistance Group (104)	3C MIPI D-PHY Interface Testing (51)		3C BERT Characterization on the UltraFLEX with the SB6G (19)	3C High, Higher, and Highest Precision with the Help of Statistics (111)
4:30	3D Introduction of Efficient Device Evaluation Using PXI (133)	3D Digital Audio Interface and Multi-Tone Signals on the Eagle Platform (25)		3D Use and Calibration of the UltraFLEX SSDM and TAC for a 10Gbps Interface (127)	3D Wafer Level Trimming Using ETS HPU & SPU-100 – Lessons Learned (138)

 

Full abstracts are available. Click a title to view the abstract.
Tuesday Morning Sessions (top)
	TEST INFRASTRUCTURE AND PRODUCTION	MIXED SIGNAL	RF WIRELESS	DIGITAL	POWER AUTOMOTIVE	ASSEMBLY TEST DEFENSE AND AEROSPACE
	Back Nine			Faster and Cheaper	PMA Accelerates Test Development	Switching & Xpress Services
9:00	4A How to Ensure Power Integrity in High-Performance Loadboards (36)	4A How Many Sigma Delta Converters Can You Test in Parallel? (26)	4A DSP Performance Measurement Tools (5)	4A Low Cost FPGA Solution for HDMI Test (62)		4A The Test, Usage, and Maintenance of a Power Switching Subsystem (94)
9:30	4B How to Standardize Code for Quick Development Cycle (31)	4B How to Develop a 32 Site Parallel Test for a Highly Complex Mixed Signal SOC (14)	4B How To Debug a CustomDSPLibrary During IG-XL Program Runs (73)	4B Fast IDDQ (24)	4B Automating Diagnostics Development Drastically Reduces Program Development Time (75)	4B Taking Advantage of Xpress Services to Simplify System Connections (57)
10:00	Break
	Fairway			J750 Techniques	PMA Test Technique – Instrument Usage	Xpress Services Workshop
10:30	5A How to Reduce Errors When Producing Finished Goods (82)	5A Using HSD1000 DSSC (Source and Capture) for Differential Pins at Dual 2X Mode (39)	5A TD-SCDMA/GSM Double-Mode RF Transceiver Test with ESA (64)	5A How to Record J750 Settings in the Datalog (110)	5A FLEX Extended Utility Data Bits: How To And Lessons Learned (23)	5A WORKSHOP 10:30-12: Xpress Services Workshop (hands on) (149)
11:00	5B Reducing DIB Debug Time with DIBViewer (103)	5B How to Capture the InRush Current Issues with IG-XL Current and Voltage Profiling (33)	5B Seminar 11-12: 4G Standards and Their Test Challenges (72)	5B Integrating a Real-Time Monitoring Tool in the J750: Lessons Learned (50)	5B DC80 for Multisite Power Management/ Automotive Chip Test (65)
11:30	5C Unique Data Testing in Parallel (68)	5C PMO for Accurate DC Voltage Measurements (91)		5C Increasing Trimming Efficiency (63)	5C Best Practices Programming of the HVPMU (21)
12:00	Lunch
Tuesday Afternoon Sessions (top)
	On the Green			IG-XL Utilities	Eagle Test Topics	TPS Rehost
1:00	6A User Tools in the Nextest Software Environment (124)		6A WORKSHOP 1-2:30: What's New in Teradyne Test Cell and Device Interface Solutions (147)	6A WORKSHOP 1-2:30: ASCII Utils & IG-XL Utils (45 min. each) (150)	6A HV Testing 1200V High Side Driver Application – Lessons Learned (139)	6A Modeling Oscillators with Virtual Sub-ps resolution in LASAR (15)
1:30	6B Log File Utilities for Nextest Magnum Family of Testers (88)					6B Transferring Legacy B2 DIFA Programs to the VDATS Using ConverterStudio: An Analysis (105)
2:00	6C Debugging Templatized Data Structures (123)		6C High Speed Video Switch Matrix Solution for High Parallel Efficiency Multisite Mixed Signal Captures (107)			6C ATLAS Integration Strategies Incorporating Ai760-20 to Emulate IFTE Functionality (53)
2:30	Break					6D Non-ATLAS Module Prototyping with Xpress Services (59)
3:00	Semiconductor Programs Business Meetings					Break
3:30	Product Roadmap Update					ATD Defense & Aerospace Product Roadmap Update
4:30	7 ROUNDTABLES AND POSTERS (4:30 PM to 6:30 PM)
	How to Use and Create Special (and Built In) User Variables (117)
	Redefining Test Program Resources (121)
	User Variable Show/Hide Utilities for Nextest Family of Testers (90)
	Test Program Startup and Configuration (122)
	The SMART Tool (47)
	Flexlm Licensing Basics (35)
	Sampling a Signal From a Digital Pattern (45)
	Dynamic Characteristic Measurement of ADC in J750 (126)
	Utilizing J750 VP12 1A Limited Utility Power and How to Prevent Corrupted HRAM (69)
	HSD1000/UltraPin800 DriverMode Tutorial – What Is It, Why Should We Care About It, and How to Set It In Your Test Program (17)
	HALI (HSD Auto Loop Inserter) 2.0 (9)
	How to Increase the J750 Parallel Site Count with the X750 Device Power Supply (42)
	IGBT Test by Eagle ETS-88 (130)
	How to Create a DIB Check Program with Excel and VBA (11)
	User Variable Deferred Value Utility for Nextest Family of Testers (87)
	Simplistic Data Logging of Active DUT (118)
	Idiomatic Usage of Remote_* Functions (120)
	Top 10 DIB Errors to Avoid (143)
	Meet the Designers (144)
	Keep the End in Mind (145)
	DIBViewer (146)

 

Full abstracts are available. Click a title to view the abstract.
Wednesday Morning Sessions (top)
	TEST INFRASTRUCTURE AND PRODUCTION	MIXED SIGNAL	RF WIRELESS	DIGITAL	POWER AUTOMOTIVE
	Golf School			Understanding Pattern Failures	PMA Accelerating Test Development
8:30	8A Introduction to IG-latoR (8)	8A Mixed Signal Concurrent Test (78)	8A Seminar 8:30-10: Introduction to RF ATE Testing for Non-RF Test Engineers (74)		8A How to Automate Performance Data Collection and Analysis (32)
9:00	8B Adaptive Test at Its Best with Teradyne’s FLEX and OptimalTest (106)	8B Concurrent Test: Lessons Learned (49)		8B Scan Failure Diagnostics for UltraFLEX (29)	8B  An IG-XL Sheet-based Interface for Serial Communication Testing on the FLEX (102)
9:30	8C How to Add TDR Verification in Production When Digital Channels Are Incorrectly Masked (30)			8C Script-Enabled Reusable HRAM (98)
10:00	Break
	On Course Corrections			When Digital Approaches RF	PMA Test Time Optimization
10:30	9A WORKSHOP 10:30-12: Revision Control and SVN General Practices (151)	9A How to Test Multi-Blocks in Parallel with the FLEX (80)	9A Seminar 10:30-12: Introduction to RF ATE Testing for Non-RF Test Engineers (cont.) (74)	9A Jitter Injection Module for Testing 10G SerDes (86)	9A Test Optimization Techniques for Mobile Device PMICs (67)
11:00		9B Charting a Course for Concurrent Test Success (48)		9B How to Use PPMU to Simulate a Virtual Resistor for LVDS VoD/VoCM Measurement (18)	9B PSETs Revisited: A Compilation of Unusual Applications from Hard Disk Drive Power Devices (34)
11:30		9C Tips for UltraFLEX to FLEX Conversion (70)		9C Programming UltraWave 12G with a Digital Pattern (108)	9C Charting IG-XL’s Test Time Measurement Capabilities (22)
12:00	Lunch
Wednesday Afternoon Sessions (top)
	19th Hole			Stretching the Testers
1:00	10A DBM Methodologies, Best Practices and Lessons Learned from FPGA Testing on Magnum (125)	10A WORKSHOP 1-2:30: Data Analyses Workshop (142)	10A Alternative De-embedding Solution for S-Parameters Test on Gen4 (85)	10A Using the VBT Overlay Language to Change Levels and Timings (55)
1:30			10B MEMS High Speed Switch Module (92)	10B Using Keepalive to Simplify Programming of Registers Setup on the UltraFLEX (56)
2:00			10C High Speed Video Switch Matrix Solution for High Parallel Efficiency Multisite Mixed Signal Captures (107)