Thank you to those of you who joined us
in the Quest for the Best of Test.
More than 240 Teradyne users and test professionals participated in the 27th annual Teradyne Users Group (TUG) Conference in Hilton Head, SC on May 3-5. TUG is the test industry's largest and longest-running customer user group conference. Among the participants this year were customers of Teradyne’s Eagle and Nextest business units.
| "We are very happy with the success of this year’s TUG Conference," said Johnny Steck, product and test engineering manager, Texas Instruments and TUG Chairman. "Despite the challenges the global economy has presented to us all, this year’s group proved we can still connect with peers and grow our knowledge of the industry." |
About the TUG 2010 Keynote Speaker
Dr. Quinn C. Horn, senior managing engineer in Mechanical Engineering and Materials Science at Exponent, Inc., began the conference with his keynote address “Powering the Mobile World: When Batteries Go Bad.”
Best Paper Winners for TUG 2010
The TUG Steering Committee is pleased to announce the winners of the TUG Conference Best Papers. The winners listed below were selected by peer evaluation on overall presentation and content.
Defense and Aerospace Track (Assembly Test)
Kevin Paton (Teradyne) for his paper The Test, Usage and Maintenance of a Power Switching Subsystem.
Digital Session Track (Semiconductor Test)
Tim Lyons, Carl Peach and Shawn Sullivan (Teradyne) for their paper How to Characterize Random, Data-Dependent, and Periodic Jitter and Rise Time, Fall Time and Other Parametrics Using the GigaDig for Digital Outputs Up to 12.8Gbps.
Mixed Signal Session Track (Semiconductor Test)
Antonino Grasso (Teradyne) for his paper Mixed Signal Concurrent Test.
Power Management/Automotive Session Track (Semiconductor Test)
Ken Moushegian and Andrew Alleman (Texas Instruments) and Doug Pounds (Teradyne) for their paper How to Measure Fast Rise/Fall Times on an Eagle Tester: Comparator to Convert to Prop Delay.
RF Wireless Session Track (Semiconductor Test)
Ronald Burke (Teradyne) for his seminar 4G Standards and Their Test Challenges.
Test Infrastructure and Production Session Track (Semiconductor Test)
Alain Tonnel (ST Ericsson) and Antonino Grasso (Teradyne) for their paper IG-XL Runtime Toolkit - A New Tool from Teradyne's Test Assistance Group.
The TUG 2010 papers and presentations are available for Teradyne users on eKnowledge.
If you have questions, please contact any of the TUG 2010 SIG chairs or delegates. Or, contact the TUG Secretary, Evan Kuhlman, by email or call her at 978-370-2654.
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