The workshops at the Technical Interchange Meeting (TIM) will provide interactive training on several of Teradyne’s top products. Through hands-on demonstrations, these sessions will offer attendees the opportunity to directly engage with Teradyne engineers. In addition, we will be holding (optional) Di-Series introductory training on Thursday, May 5, which is open to all TIM attendees. Read below for more details on the training and workshops available at TIM.

High Speed Subsystem Workshop

Date: Tuesday, May 3

Time: 3:30 - 5:00 PM

HSSub Software Workshop

The focus of this workshop is on the sub TPS development run on the HSSub subsystem PC. This is the portion of HSSub TPS development that provides the glue between the TestStation computer and HSSub Apps, which control the hardware in the HSSub PXIe chassis.

Outline

  • Overview of HSSub TPS software architecture
  • Tutorial of how to create a new sub TPS
  • TPS to sub TPS Communication with Application Services
  • Using an HSSub App in your sub TPS to interface to hardware

AIT Bus Test Workshop

Date: Wednesday, May 4

Time: 1:00 - 3:00 PM

AIT Data Bus Test Workshop

This session provides a look at various data bus technology. The tutorial contains an overview of various data bus technologies being used stand-alone, as well as integrated together, on various avionics vehicles today. This is a basic data bus overview intended for engineers who may work with one data bus, but are interested in learning about the operation of other data bus technologies currently in use.

Outline

  • Data Bus Overview
  • Federated Data Bus
    • ARINC-429
    • MIL-STD-1553
    • MIL-STD-1760
    • CANbus
    • IEEE-1394
  • Ethernet Networks
    • Ethernet, 802.3
    • ARINC-664 / AFDX©
    • Time-triggered
  • Fibre Channel Networks
    • Fibre Channel Low Layers
    • Upper Layer Protocol
    • MIL-STD-1760E
  • Functional Avionics Testing Examples

Digital Test Training - OPTIONAL

Date: Thursday, May 5

Time: 9:00 AM - 12:00 PM

Introduction to Digital Test

This session provides a look at digital testing techniques for Functional Test. The tutorial contains an overview of digital testing from Design for Test techniques to Functional Digital Tests and Diagnostics.  This is a basic Digital Testing class intended for entry-level engineers with little to no experience in digital testing. The training works under the assumption that the students have had basic courses in logic design, computer science, and probability theory. Most of the algorithms are presented in the form of pseudo-code.

Outline

  • Digital Testing Overview
  • Types of Faults
  • Conventional Test Techniques
    • ICT/Functional
    • Software/Fixture Considerations
  • Functional Test Techniques
    • Development Tools
    • Synchronization to the UUT
    • Memory Testing
    • Parallel/Serial Testing
    • Static/Dynamic Testing
  • Functional Testing Examples using a Di-050
  • Diagnostics/Debug