TestStation Multi-Site test systems deliver true parallel in-circuit test and functional board test. The key to Multi-Site architecture is intelligent resource allocation.
Test electronics for each site are close to the test interface, ensuring short signal paths to test instrumentation. Common cooling, power, and infrastructural elements that support all the test sites reduce system physical size and cost.
With their high-density design, TestStation Multi-Site test systems may be configured over a wide range of pin counts, automation, and test options to meet every production test requirement.