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The ETS-800 test system is a next-gen automotive test platform with the industy's highest throughput and fastest time to market. The platform covers a broad range of analog, digital, and mixed-signal applications such as Automotive SOCs, Power Management ICs, and general purpose analog and mixed-signal devices. The system provides an air-cooled test head containing four sectors of instrument slots. Each sector contains 10 slots for a total of 40 test head slots to accommodate a robust suite of instruments.

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  • Applications

    The ETS product line has a very successful history of addressing the precision analog and power management and automotive market areas for high volume low-cost manufacturing. The ETS-800 test system provides new and expanded capabilities to address the test requirements of a broader array of analog, digital, and mixed-signal devices.

    The drive toward higher levels of device functionality is being complemented with the need for increased levels of product quality. This drives test programs to have longer test lists resulting in longer test times in a cost sensitive environment. For this reason, the ETS-800 Test System Platform offers new and better ways to maximize throughput and provides an easy-to-use comprehensive programming environment.

     The Typical Markets Include:

    • Automotive ICs
    • Power and battery management solutions
    • High-efficiency lighting and LED drivers
    • Motor controllers
    • General purpose analog and mixed-signal devices
  • Advantages

    Multi-Sector Technology with ExpressLinkTM

    Leveraging low-cost multi-core technology to provide a dedicated processor for each test head sector for pure parallel test control to achieve ultra-high parallel test efficiency.

    • ExpressLink high speed, ultra low latency test system bus 

    APEx™ - Adaptive Pin Expansion Architecture

    • Increases site count without adding system resources
    • Reduces DIB hardware to simplify design and lower DIB costs
    • Maximizes Tester Resource Utilization Efficiency (TRUE) leverages optimized system configuration

    ExpanDIB™

    Three unique DIB sizes: Small, Medium and Large

    • Large size maximizes application space for increased site count
    • Small size minimizes DIB cost for focused applications

    SmartPin3™

    • Supports rapid analog pattern based testing 
    • Enables synchronous concurrent testing
    • Floating Resource Instrument Technology
      • Isolation from ground shifts and noise between sites
      • Instrument stacking for greater application flexibility

    Eagle Vision MST™ Software

    • Supports Multi-Sector Technology (MST) with multi-core computing creating a high-efficiency software environment
    • Test Engineers become more efficient with easy-to-use development and debug tools
      • New users quickly become proficient due to the short learning curve

  • Configurations

    The ETS-800 Test Platform is designed with a unique Multi-Sector Architecture whereby the system is inherently scalable in terms of site count up to 1024 total sites. The system supports up to four sectors which are typically configured in a symmetrical fashion. Each sector represents a complete mixed-signal multisite test system capable of testing a wide variety of products. Systems are controlled via a single multi-core test computer and may be populated with one, two, or four sectors based on the desired maximum site count.


  • System Options

    An important feature of the ETS-800 is the Adaptive Pin Expansion (APEx) architecture, which enables economical site count expansion. The power of APEx is that it allows the test system to stretch to higher site counts through resource sharing, while minimizing DIB based switching circuitry and saving valuable application space. The APEx architecture provides built-in signal multiplexing distributed throughout the various resources of the system.

    Instrument Options:

    APU-32
         Analog Pin Unit 32 (APU-32) is a single slot, 32 channel, 80 V, four quadrant V/I with eight current ranges (from 200 mA to 1 µA) and per-pin AWG and digitizing capabilities.

    CAM II
         Capacitance Application Module (CAM II) is an application-specific resource module designed to measure extremely low capacitance levels in the sub-picofarad range. The CAM II can be used across all ETS series test platforms and all FLEX series test platforms.

    HSD-32
         The High Speed Digital 32 (HSD-32) is a single-slot, high speed digital instrument containing 32 independently programmable I/O channels, organized as two separate 16 channel subsystems. HSD-32 provides time measurement capabilities for ETS-800 test systems using the Time Stamper Unit (TSU).

    MCMUX
         The Medium Current Multiplexer (MCMUX) board resides in the test head and provides 64:1x4 solid state pattern controlled multiplexers. This board allows the user to distribute instrument pins to multiple DIB pins, reducing the number of instruments required for a typical multisite test application.

    PAM
         The Picoamp Module (PAM) is an application-specific instrument module designed to force voltage and measure subnanoamp currents. The PAM can be used across all ETS series tester platforms.

    QMS-T
         The QMS-T instrument (shown above in an FR carrier board for use in an ETS-800 system) provides four independent floating differential voltmeters for measuring both DC and AC signals. Each channel offers nine voltage ranges from ±200 V to ±0.5 V with optional use of either a 10 Msps 12-bit digitizer or a 200 ksps 16-bit digitizer.

    SPMB
         The SPU-2112 Mux Booster Board (SPMB-2112) is an optional booster instrument that enables the SPU-2112 to deliver extended pulse current capability. A high current booster cable connects one booster channel to one SPU-2112 channel. Each booster board can supply high current pulse power to eight SPU-2112 channels (two SPU-2112 boards). The SPMB-2112 also includes 16:1x4 solid state pattern controlled multiplexers which support the full SPU-2112 operating range. Each channel is fully isolated (80 Vrms) from pin-to-pin and pin-to-ground.

    SPU-2112
         The SmartPin Unit 100 V/10 A (SPU-2112) is a single-slot, quad-channel, ±100 V SmartPin with eight current ranges. The SPU-2112 spans a wide range of voltage and current combinations, making it an extremely versatile instrument. The SmartPin architecture incorporates an AWG and a digitizer within a conventional four quadrant V/I.

    UPU-64
         The Utility Pin Unit 64 (UPU-64) is a 64-channel multi-function instrument organized in four independent banks of 16 channels. Each bank consists of 16 20 MHz high voltage digital channels (-1 V to +24 V), four time stampers, and two dual 2x8 force/sense cross-point APEx multiplexer. Each digital channel includes an integrated PPMU, a dynamic load, multiplexed access to four local time stampers, remote measure voltage capability, and access to the 2x8 APEx matrix.

  • Software

    The Eagle Vision Software Suite is a robust test development environment, elevating applications program development and debug to new heights. Every Eagle test system is controlled by a PC, running a standard Microsoft® operating system and using Microsoft® .NET C/C++ development tools for code creation. Eagle’s software tools are easy to learn, easy to use and are fully integrated into the Microsoft® Visual Studio® development environment.

    A suite of automatic code generation tools supports the complete test system command set, providing users with the program control they need without forcing them to memorize coding syntax. Wizard tools are available for creating tests, editing test limits, and changing the test execution flow. Graphical plotting tools are provided for simple point-and-click plotting of test-oriented waveforms. The eRAIDE debug environment makes it easy to view and change tester hardware settings. A robust help file system navigates users through the tool set and provides coding examples, further reducing development time.