FLEX family AC instrumentation provides source and capture test capability with arbitrary waveform generation (AWG) and digitizing to meet escalating test requirements for SiP, SoC and high performance devices with the lowest cost of test.
FLEX family DC instrumentation provides precision voltage/current (V/I) source and measure test capability for a wide variety of SoC devices. The integrated instruments source and measure voltage and current in four quadrant operation.
DC Device Power Instrumentation
FLEX family Device Power Supply (DPS) instrumentation provides precision voltage source and current measurement test capability across a wide variety of devices. Instruments can force voltage and measure current in single or dual quadrant operation, and sources can be merged to reach higher current levels.
FLEX family digital instrumentation provides broad functionality and flexible test capability to meet the demands of evolving device performance and test methodologies at the lowest cost of test.
Teradyne’s award-winning IG-XL Software transforms test program development. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
Learn more about IG-XL Software