The LCD Driver market is extremely cost sensitive. Teradyne leveraged the J750 platform’s small footprint, high throughput and low cost-of-ownership and created the LCD Driver instrument solution that reduces cost-of-test for mobile display drivers with an instrument architecture that addresses current and emerging display driver test requirements, including TDDI.

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  • Applications

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    LCD Driver

    Touchscreen Devices

    Touch Display Driver Integration (TDDI)

  • Advantages
    • Single platform coverage for DDI and emerging TDDI test requirements
    • Delivers 30% to 40% lower cost of test
      • Reduce capital expenditure
      • Higher site count capability for focused test insertions
    • J750EX-HD offers operational flexibility to cover a broad range of SOC consumer digital test applications
    • LCD Driver solution available as a simple upgrade on over 1,000 J750 systems available at OSATs worldwide
  • Configurations

    J750 LCD Instrument Solution

    • Available as an upgrade to all J750 models
    • Up to 2,416 measurement channels for LCD source driver testing
    • Graphical debug tools for grayscale measurement with IG-XL software
    • LCD Meter - <1us full scale step settling time
    • High Density Converter Test Option (HD CTO) can easily be added to the J750 for discrete touchscreen controller testing
    • High-speed instrument for serial display interface test such as MIPI
  • System Options

    J750 has a complete suite of digital, DC and analog instrumentation to cover a broad range of consumer semiconductor test requirements and offer densities to deliver high site count testing.

    • HD DPS (Device Power Supply) for precision controlled device power
    • HDVIS (High Density VI Source) for higher site count and pattern control
    • HD CTO (Converter Test Option) for testing embedded converters
    • HD APMU (Analog Pin Measurement Unit) for mixed signal test


  • Software
    IG-XL-245x100-TeradyneTeradyne’s award-winning IG-XL software transforms test program development. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.

    Learn more about IG-XL Software