alt

High Performance, Low Cost, High Efficiency, Parallel Memory Test Solution

Teradyne's Magnum 2x system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices. Magnum 2x's largest configuration provides up to 10240 digital channels and all Magnum 2x configurations provide a 220MHz pattern rate, 400MHz Clock/Data, and 800Mbps SuperMux data on each channel.

    Expand All 
  • Applications

    Memory

    • NOR Flash
    • NAND Flash
    • DRAM
    • eMCP
    • Memory Cards







  • Advantages

    Highly Parallel Memory Test

    • Magnum 2x doubles parallel test capability of Magnum 2

    High Speed Site Controller

    • 2.8GHz Dual Core CPU per site assembly for maximum parallel test through and performance

    Scalable Platform

    • Scales from low-channel count engineering solution to high-channel count production solution with superior throughput and high parallel test efficiency

    Bad Block Management

    • Real time error logging for ECC, Bad Block, and DQS/DQ align

    ECC Counters per DUT

    • Real time DMA logging to site CPU from the pattern

    EBM Independent Data Per DUT

    • Fast parallel test with Read, Write, and Mask functions

    Logic Test Coverage

    • Mixed Patterns, Full APG with Topo Scrambling, Full Logic pattern sequencer with LVM vector memory per pin, and APG + LVM sequences in the same pattern

    Magnum 2x has all the features of Magnum 2

  • Configurations

    Magnum 2x PV

    • Five-slot chassis that supports up to 1,280 digital channels in 256 channel increments (configurable from 256 pins to 1,280 pins)
    • Air-cooled, low pin-count test solution or test program development, device engineering and low volume production
    • Final test and wafer sort production in support of the high-volume production configurations
    • Five-slot chassis supports up to 640 digital I/O pins in 128 pin increments
    • Configurable with multiple DPS analog boards matched to the appropriate number of digital I/O channels to meet the requirements for complex memory and logic applications

    Magnum 2x SV FT

    • Air-cooled configuration specifically designed for integration to head-under handlers
    • Configurable with up to 2,560 channels

    Magnum 2x SSV LC FT

    • Water-cooled, high pin-count solution for massively parallel final test of flash, complex memory and logic devices
    • Configurable from 256 pins up to 5,120 digital pins in 256 pin increments to maximize the parallel test requirement of the final test floor

    Magnum 2x GV LC FT

    • Utilizes the Vertical Plane Manipulator (VPM) for efficient integration to industry standard handlers
    • VPM is a targeted direct-dock solution for final test and specifically designed to easily integrate with high volume production test handlers for massively parallel test.
    • VPM’s dual-hifix positioner, simplifies docking 3rd party HiFix solutions between the GVLC and the industry standard handlers to provide a complete test cell solution
    • VPM is motorized to facilitate docking and un-docking of the HiFix interface

    Magnum 2x SSV WS

    • Water-cooled, high pin-count test solution for massively parallel test at wafer sort
    • Configurable from 256 pins up to 5,120 digital pins in 256 pin increments to match the specific parallel requirements for one-touch or multi-touch wafer test based on specific die size and specific wafer size requirements
    • Wafer sort interface is specifically designed to use a round 520mm probe card. Optional loadboards and calibration boards are designed in the same form factor

    Magnum 2x GV FT

    • Water-cooled, high pin-count solution for massively parallel final test of flash, complex memory and logic devices
    • Configurable from 256 pins up to 10,240 digital pins in 256 pin increments to maximize parallel test requirements of the final test floor
    • Integrated with Teradyne Vertical Plane Manipulator for direct docking to very high capacity device handlers
    • Single cavity or dual cavity handler configurations
    • System-mounted docking hardware

    Magnum 2x GV LC FT

    • Utilizes the Vertical Plane Manipulator (VPM) for efficient integration to industry standard handlers
    • VPM is a targeted direct-dock solution for final test and specifically designed to easily integrate with high volume production test handlers for massively parallel test.
    • VPM’s dual-hifix positioner, simplifies docking 3rd party HiFix solutions between the GVLC and the industry standard handlers to provide a complete test cell solution
    • VPM is motorized to facilitate docking and un-docking of the HiFix interface

    Magnum2x GV WS

    • Water-cooled, high pin-count test solution for massively parallel test at wafer sort
    • Configurable from 256 pins up to 10,240 digital pins in 256 pin increments to match the specific parallel requirements for one-touch or multi-touch wafer test based on specific die size and specific wafer size requirements
    • Wafer sort interface is specifically designed to use a round 520mm probe card. Optional loadboards and calibration boards are designed in the same form factor


  • System Options

    DPS

    • Option for testing low pin count devices that must be tested highly parallel
    • Maximize resource utilization and device parallelism while maximizing production test efficiency and throughput
    • Available in 32- and 64-channel configurations

    TCALDX

    • High-throughput, low-cost digital channel calibration option
    • Hardware and software solution calibrates system faster than the “relay-tree” calibration technique
    • Available for both final test and wafer sort configurations

    Traceability

    • NIST certified instruments to support traceability (Magnum 2x systems do not directly support NIST compliance)
    • For AC measurement, TCALDX port provides access to the internal crystal of Magnum 2’s AC sub-system, one per site assembly. The timing path is routed through a digital counter cable to a NIST Certified Stanford Research SR620 counter (or equivalent) to provide a path for AC traceability.
    • For DC measurements, TCALDX port provides access to a reference voltage from Magnum 2’s DC sub-system. Reference voltage is sourced from each DP board on a site assembly and routed through a digital multimeter cable to a NIST certified Agilent 3458A multimeter (or equivalent) to provide a path for DC traceability.

    Interface Solutions

    DIB's, PIB's, Loadboards, Calibration BD's, DUT BD Stiffener Kits, Probe Card Stiffener Kits. Final Test Interfaces, Wafer Probe Interfaces, Docking Solutions, and Test Cell Integration



  • Software
    Magnum OS, a DUT based multisite architecture has been architected to provide test engineers with true device-oriented parallel test programming environment. A test engineer writes a test program for a single device and the systems hardware clones the tests into multiple sites automatically. Test programs developed on the Magnum 2 EV or Magnum 2 PV can be used on production version Magnum 2’s to maximize parallel test. All the software tools are site savvy, enabling test engineers to investigate device performance, on any DUT site, as though it was a one-site tester.