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High Performance, Low Cost, High Efficiency, Parallel Memory Test Solution

 Teradyne's Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices. The Magnum 2's largest configuration provides up to 5120 digital channels and all configurations provide a 220MHz pattern rate, 400MHz Clock/Data and 800Mbps SuperMux data on each channel.

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  • Applications

    Memory

    • NOR Flash
    • NAND Flash
    • SRAM
    • DRAM
    • MEMs

    SOC

    • Microcontroller
    • Low-end SOC
    • Converters

  • Advantages

    Scalable Platform

    • Scales from low-channel count engineering solution to high-channel count production solution with superior throughput and high parallel test efficiency

    Highly Parallel NOR/NAND Flash Device Test

    • Tests up to 80 NOR Flash devices with up to 64 device pins and up to 320 NAND Flash devices up to 16 device pins
    • Tests up to 320 NOR Flash devices with up to 16 device pins or 640 Flash devices with up to 8 DUT pins

    Dual Bank ECR

    • Includes hardware acceleration and RA processor
    • Simultaneous capture and scan reduces test time

    Full Speed ECR

    • 800Mbps capture on all channels

    Unique data behind each channel

    • DRAM eFuse and NAND Bad Block management per DUT

    Logic Test Coverage

    • Mixed Patterns
    • Full APG with Topo Scrambling
    • Full Logic pattern sequencer with LVM vector memory per pin
    • APG + LVM sequences in the same pattern

  • Configurations

    Magnum 2 EV

    • Self- contained, low-power engineering test system
    • For customer and Lab applications that require test program development and debug
    • Up to 128 digital I/O pins plus an option board (DPS, VRC, or MPAC)
    • Internal air compressor eliminates need for facility compressed air to operate the load board latch mechanics
    • Runs on standard 110 VAC power (220 VAC Europe)

    Magnum 2 PV

    • Five-slot chassis supports up to 640 digital I/O pins in 128 pin increments
    • Can be configured with multiple DPS, VRC, or MPAC option boards matched with the appropriate number of digital I/O channels to meet the requirements for complex memory and logic applications 

    Magnum 2 SV

    • High-mix production solution
    • Up to 1,024 digital pins for parallel test
    • Final test and wafer sort production
    • Compatible with industry standard handlers and wafer prober, including hinge and column  manipulators

    Magnum 2 SSV FT

    • For final test applications
    • Configured with up to 2,560 digital channels
    • Integrated with Teradyne Vertical Plane Manipulator for direct docking to very high capacity device handlers
    • Single or dual cavity handler configurations
    • System-mounted docking hardware

    Magnum 2 SSV WS

    • For Wafer Sort applications
    • Configured with up to 2,560 digital channels
    • Easily integrated to a number of third party hinge and column manipulators Manipulator motor lock-out solution that communicates with the prober that the interface is latched

    Magnum GV FT

    • For final test applications
    • Configured with up to 5,120 digital channels
    • Integrated with Teradyne Vertical Plane Manipulator for direct docking to very high capacity device handlers
    • Single cavity or dual cavity handler configurations
    • System-mounted docking hardware

    Magnum GV WS

    • For wafer sort applications
    • Configured with up to 5,120 digital channels
    • Easily integrated with third  party hinge and column manipulators
    • Manipulator motor lock-out solution that communicates with the prober that the interface is latched

  • System Options

    MPAC

    • Analog source and capture option
    • Available with 24- or 48-channels of source/capture/Vref
    • Voltage reference for multiple test applications including embedded converters
    • Integrated parametric measurement unit (PMU) available at any instrument channel

    DPS

    • Option for testing low pin count devices that must be tested highly parallel
    • Maximize resource utilization and device parallelism
    • Available in 32- and 64-channel configurations

    VRC

    • Voltage Reference Channel option
    • Available in 32- and 64-channel configurations
    • Programmable through the application programmers interface (API)

    MPAC24/DPS32

    • Option is a combination of 24 MPAC channels and 32 DPS channels.

    VRC32/DPS32

    • Option is a combination of 32 VRC channels and 32 DPS channels.

    TCALDX

    • High-throughput, low-cost digital channel calibration option
    • Hardware and software solution calibrates system faster than the “relay-tree” calibration technique

    Traceability

    • NIST certified instruments to support traceability (Magnum 2 systems do not directly support NIST compliance)
    • For AC measurements, TCALDX port provides access to the internal crystal of Magnum 2’s AC sub-system, one per site assembly. The timing path is routed through a digital counter cable to a NIST Certified Stanford Research SR620 counter (or equivalent) to provide a path for AC traceability.
    • For DC measurements, TCALDX port provides access to a reference voltage from Magnum 2’s DC sub-system. Reference voltage is sourced from each DP board on a site assembly and routed through a digital multimeter cable to a NIST certified Agilent 3458A multimeter (or equivalent) to provide a path for DC traceability.

    Interface Solutions

    DIB's, PIB's, Loadboards, Calibration BD's, DUT BD Stiffener Kits, Probe Card Stiffener Kits. Final Test Interfaces, Wafer Probe Interfaces, Docking Solutions, and Test Cell Integration
  • Software
    The Magnum OS is a DUT-Based Multi-Site Architecture - Magnum’s software has been architected to provide test engineers with true device-oriented parallel test programming environment. A test engineer writes a test program for a single device and the systems hardware clones the tests into multiple sites automatically. Test programs developed on the Magnum 2 EV or Magnum 2 PV can be used on production version Magnum 2’s to maximize parallel test. All the software tools are site savvy, enabling test engineers to investigate device performance, on any DUT site, as though it was a one-site tester.