Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

J973EP logo
J973EP VLSI Test System photo
  Device Test Solutions for:
 

.: Microprocessors
.: Core Logic

 
J973EP Structural to Full Performance VLSI Test
 
 

The J973EP provides diverse test solutions needed for structural to functional testing by manufacturers and designers of high-performance devices, including microprocessors, core logic, integrated processors,digital signal processors, and network processors. The EP's flexible configuration provides the ability to switch between functional and structural test in real-time to minimize test cost by matching test performance to device test requirements only when needed. The J973EP expands the performance curve on accuracy, precision device power, and differential bus testing.

J973EP Enhancements

  • Real Time Enabling™
    • Software licensing is delivered, in real-time, to enable hardware performance required for any specified period of time.
  • inSync Differential Test™ Option
    • Source synchronous differential bus test option with a data rate of 1.6 Gbps and Device Strobed Comparators (DSC) for testing source synchronous buses as they will be used in the final application
  • 200A Ganged Voltage Source Power Supply Option
    • A precision device voltage source capable of providing up to 200A, to reduce voltage error so devices can achieve maximum frequency, yielding higher revenue devices.

Other options include:

  • Dual Transmission Line
  • High-Speed Clock
  • Memory Test Option
  • VHF Digitizer Option
  • 100A Ganged Voltage Source
  • 50A Ganged Voltage Source
  • Time Digitizer Option

 

Real Time Enabling and inSync Differential Test are trademarks of Teradyne, Inc.