Test Products
TOKYO--(BUSINESS WIRE)--Teradyne Japan (NYSE:TER) hosted its seventh annual Teradyne Technical Seminar. Approximately 150 Japanese Teradyne test system users and engineers gathered in Tokyo at the Cerulean Tower Tokyu Hotel on November 17 to share technical knowledge and exchange ideas related to the world of semiconductor device test. The program featured keynote presentations by Mr. Fumiaki Sato, Managing Director, Co-Head of Global Markets Research, Deutsche Securities Inc. and Dr. Lee Myung-Hee, Vice President, Semiconductor/System LSI Division, Samsung Electronics.
During the keynote, Mr. Fumiaki Sato discussed the challenges to Japan’s domestic electronics manufacturers. “To restore competitiveness and increase profitability, electronics products manufacturers need to converge resources and look to grow exclusive technologies to increase global competitiveness and market share,” said Mr. Sato.
In his presentation, Dr. Lee Myung-Hee looked at the increasing performance demands for flat-panel display driver ICs (DDI). “Device driver manufacturers have many opportunities for innovation and the creation of smarter devices,” said Dr. Lee. “Technologies such as Mobile Image Enhancement, Ambient Light Processing, and Mobile Color Management will give consumers higher picture resolution, customized color management, and faster image response time, and achieve it all at lower cost.”
This year’s conference, with the theme ”Navigate, Collaborate, Participate,“ brought technical experts from many leading semiconductor companies in Japan who participated in sessions on Production Integration & Tools, SOC Test Solutions, High Speed Test, and Image and Mixed-Signal Test. Topics covered included testing Disk SOC, HDTV, serial buses and high-speed DDR, concurrent test, and test cost reduction.
About Teradyne Japan
In an effort to provide the best customer service, Teradyne Japan (Teradyne K.K.) was established in 1978. It has the largest installed base of image sensor device test systems in the world with the IP750 and provides sales and service for Teradyne semiconductor test systems including the J750 and the FLEX(TM) Test Platform. Sales and support offices are located in Tokyo and Osaka. Design engineering, manufacturing, and product marketing is located at the facility in Kumamoto, Kyushu Island. Products designed in Kumamoto are distributed both in Japan and to customers worldwide. For more information in Japanese, visit www.teradyne.co.jp.
About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2005, Teradyne had sales of $1.08 billion, and currently employs about 3,900 people worldwide. For more information, visit www.teradyne.com.
Teradyne(R) and FLEX are trademarks or registered trademarks of Teradyne, Inc. in the US and other countries.
