Keynote Speakers for 2007 Teradyne Users Group Conference Announced

Focus on “Zero Defects” Manufacturing

NORTH READING, Mass.--April 5, 2007--Teradyne (NYSE:TER), a world leader in high efficiency, low-cost test, today announced the keynote speakers for the 2007 Teradyne Users Group (TUG) Conference to be held at the Sheraton Universal Hotel in Hollywood, California on April 23-25, 2007. Speakers Keivan Keshvari, Director, Product and Test Engineering, Freescale Semiconductor, and Ahmad Abde-Yazdani, Director of Test Engineering, Infineon Technologies, will look at the impact of “zero defect” methodologies in manufacturing semiconductors.

With the ever increasing electronic content in today’s end products and its impact on design and manufacturing, the TUG Steering Committee wanted to bring focus to both the historical and future view of the concept of “zero defects” and its impact – what it means for the consumer and where it is going.

The automotive industry has proven to be one of the most stable and consistent segments in the electronics industry. Two of the key requirements for testing automotive semiconductors are the breadth of coverage for the device and the quality of test. Both of these requirements help to drive the need for “zero defect” standards. This year’s keynote speech, presented by two senior managers from top semiconductor manufacturers, Freescale Semiconductor and Infineon Technologies, will look at how the concept of “zero defects” has evolved and how it is being applied.

“The concept of zero defects was first applied in the aerospace industry and is now widely accepted across many industries, especially in automotive electronics where safety is a key concern,” said Kevin Walt, Principal Test Engineer, Broadcom and TUG 2007 Chair. “When choosing this year’s keynote speakers, we wanted to recognize these key quality control techniques, and tap into the experience of leading companies in the automotive market segment who are also key contributors to TUG. “

The program for the 24th annual TUG Conference is available at the TUG web site where customers can review the technical program and register on line for the conference. Special TUG pre-registration discounts are available on-line until April 19, 2007 and registration for the Sunday Seminars is open until April 13, 2007. To learn more about TUG and to register for this year's exciting conference, visit the TUG web site at http://www.teradyne.com/tug.

About TUG

The Teradyne Users Group (TUG) was started in 1983 by Teradyne customers. The event is open to all licensed users of Teradyne's test systems and software products and is held each year at rotating locations within the U.S. The conference consists of technical papers, poster sessions and tutorials that present the latest in test technology. TUG is managed by an annually elected steering committee of Teradyne users and Teradyne appointed delegates.

About Teradyne

Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics for the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2006, Teradyne had sales of $1.38 billion, and currently employs about 3,800 people worldwide. For more information, visit www.teradyne.com. Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.