Teradyne Users Group Conference Draws Large Crowd

NORTH READING, MA – May 10, 2007 – Teradyne, Inc. (NYSE: TER), a world leader in high efficiency, low-cost test, announced that over 390 Teradyne users and test professionals participated in the 24th Teradyne Users Group (TUG) Conference in Hollywood, CA on April 23 – 25th. TUG is the test industry's largest and longest running customer user group conference.

Keynote addresses on the impact of “zero defect” methodologies for manufacturing semiconductors kicked off the conference presented by Keivan Keshvari Director, Product and Test Engineering, Freescale Semiconductor Inc. and Ahmad Abde-Yazdani, Director of Test Engineering, Infineon Technologies. Attendees representing over 45 companies from 15 countries then participated in sessions presenting over one hundred and forty technical papers and tutorials, across six major programs including: digital, mixed-signal, power management/automotive, production integration & hardware/software interface, RF wireless and mil/aero.

New features at the 2007 conference included a Sunday Seminar Series and an Open Forum Discussion where customers could pose their questions directly to Teradyne managers. In addition, the conference included poster and roundtable sessions, and a Vendor Fair with exhibits by suppliers of products and services used for Teradyne systems.

A new steering committee was also elected, with Johnny Steck, Texas Instruments, to serve as the new TUG Chairman and Tom Munns, Freescale Semiconductor, as Vice Chairman.
“Mission Accomplished,” said Kevin Walt, Principal Test Engineer, Broadcom and TUG 2007 Chairman. “For those who accepted the challenge, TUG 2007 proved to be a valuable opportunity to meet new people, learn about new directions in testing, and establish valuable relationships. The conference gives people the chance to share tools and methods that work in the never ending quest to reduce cost of test and deliver the best possible products to customers.”

“I consider myself lucky to be working with a dedicated and professional group of industry users as well as Teradyne employees,” said Johnny Steck, Senior Product Engineer, Texas Instruments and incoming TUG Chairman. “We’re looking to continue to build on this group’s success as we plan for the 25th Teradyne Users Group conference in 2008.”

The TUG 2007 papers and presentations are now available for Teradyne users via eKnowledge. To learn more about TUG 2007 or to get involved in TUG 2008, please visit the TUG web site at http://www.teradyne.com/tug.

About TUG
The Teradyne Users Group (TUG) was started in 1983 by Teradyne customers. The event is open to all licensed users of Teradyne's test systems and software products and is held each year at rotating locations within the U.S. The conference consists of technical papers, poster sessions and tutorials that present the latest in test technology. TUG is managed by an annually elected steering committee of Teradyne users and Teradyne appointed delegates.

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics for the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2006, Teradyne had sales of $1.38 billion, and currently employs about 3,800 people worldwide. For more information, visit www.teradyne.com. Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.