SHANGHAI, CHINA--(BUSINESS WIRE)--April 25, 2003--Teradyne, Inc. (NYSE:TER) announced that Global Advanced Packaging Technology Co. Ltd. (GAPT) of Shanghai, in a competitive selection process, has purchased the Catalyst test system for a wide range of device test. The Catalyst joins the existing installed base of Teradyne test systems in production at GAPT's Zhangjiang Hi-Tech Park facility. The Catalyst will test DVD, chipset, baseband, disk controller, and RF devices used in the consumer, computer, wireless and communication industries. The selection was based on Catalyst's industry leading production throughput and Teradyne's unparalleled strength in global customer support.
"Catalyst delivers the highest production throughput in the industry with a flexible architecture that enables multisite test," said Mr. CK Lin, CEO of GAPT. "Catalyst is widely accepted and preferred by our customers because of its superior parallel test capability and system architecture which can achieve the best test economics. It is essential for a packaging and test company to select a platform that can test the majority of the SOC device market, wireless or non-wireless, and Catalyst does that best. In addition to the superior economics and test capability, we are continually impressed by the customer support we receive from Teradyne. GAPT has confidence in selecting Teradyne, once again, for our testing demands."
"Whether it's GSM transceivers, WLAN devices, or complex SOC device test, GAPT works hard to deliver outstanding test economics while achieving exceptional quality standards," said Hock Chiang, Managing Director, Teradyne Semiconductor Test Operations in China. "In addition to delivering low cost of test, GAPT has earned a reputation for consistently delivering a range of exceptional assembly and test services for an assortment of device technologies. We're pleased that the technical capability and performance of the Catalyst will be part of delivering a range of test solutions for their customers."
About Catalyst
Catalyst dominates the SOC market with 1000 systems shipped. Test capabilities include full coverage for DSL, wireless/RF, networking, and power management applications. With more than 4,000 individual users worldwide, Catalyst's IMAGE(TM) programming system is the most widely used ATE software environment. Catalyst offers multi-site testing, providing the best test economics, and the most complete array of analog instrumentation for test coverage and production flexibility. When a mobile phone call is placed, or a PC, printer, scanner, pager, or DVD is utilized, Catalyst tested ICs make it happen and at the lowest cost of test.
About GAPT
GAPT, located in Zhangjiang Hi-Tech Park in Pudong New Area, Shanghai, aims to provide customers in China and worldwide services from packaging design, wafer bumping, wafer sort, die storage, assembly to final test and drop ship. Integrating with the wafer foundries and IC design houses setting around, GAPT is able to provide one-stop-shopping. GAPT also receives wafers globally for the assembly and test subcontracting service from the first day. GAPT's testing capability covers consumer, communication and computer-related products with high performance of digital, analog and mixed signal testers. The testing group can support customers on new program development, testing correlation and conversion to provide a turnkey service from programming to hardware design. For more information, please visit www.GAPTL.com.
About Teradyne
Teradyne (NYSE:TER) is the world's largest supplier of Automatic Test Equipment, and a leading supplier of interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2002, Teradyne had sales of $1.22 billion, and employed about 7000 people worldwide. For more information, visit www.teradyne.com.
IMAGE is a trademark of Teradyne, Inc.

