Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

FLEX News Archive

2007 | 2006 | 2005 | 2004 | 2003 | 2002

2007

December 12 , 2007
Wolfson Purchases Multiple Teradyne UltraFLEX Systems for Testing New Audio CODEC Device

December 3 , 2007
Teradyne Sponsors FSA Awards Dinner Celebration

November 27 , 2007
AMI Semiconductor Picks Teradyne FLEX Test Platform for Automotive Devices

November 19 , 2007
Teradyne Japan Hosts Eighth Annual Technical Seminar

November 12 , 2007
Teradyne Ships FLEX Systems to KYEC for RF Testing

September 11 , 2007
Teradyne IG-XL Software Offers Real-time Histogram and Scripting Tools with SEDana

August 8, 2007
Teradyne microFLEX Purchased by Carsem for Dependable Low-Cost Automotive Device Test

July 25, 2007
Teradyne Introduces DC90XP for Automotive and Power Management Markets

July 8 , 2007
Microchip Technology Selects Teradyne as Microcontroller Test Supplier

May 22, 2007
Dialog Semiconductor Designates Teradyne FLEX as Preferred Platform

May 14, 2007
Sirific Chooses Teradyne FLEX for Next-Generation Wireless Test

April 10, 2007
Teradyne Recognized for Excellence by Texas Instruments

March 29, 2007
Teradyne and Tessolve Services Host Test Excellence Technical Seminar in India

February 8, 2007
Registration Opens for 2007 Teradyne Users Group Conference

January 8, 2007
Alereon Teams with Teradyne for Ultrawideband RF Test Solutions