Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Toshiba Selects Teradyne's FLEX Test System; Toshiba to Use New Universal Slot Architecture for High-mix Consumer Device Test

BOSTON--(BUSINESS WIRE)--Sept. 24, 2002--Teradyne announced the Toshiba Corporation, Semiconductor Company, System LSI Division of Kitakyushu, Japan has purchased multiple FLEX test systems. Toshiba will use the Universal Slot architecture of the FLEX to configure device test coverage for a wide range of low-cost, high-volume devices including mixed signal LSIs. Toshiba's purchase of the new FLEX is the first shipment of the test system in Japan.

"Japan is in the formative stages of digital TV broadcasting," said Mr. Yoshihiro Yoshida, Senior Manager of the IC Department, Kitakyushu Operation at Toshiba Corporation Semiconductor Company. "Our selection of the FLEX prepares Toshiba for the high-volume production that burgeoning digital TV devices require while providing us with the configuration flexibility to test a mix of consumer devices like motor driver and DVD. Toshiba selected FLEX as our solution for the demanding and increasing high-volume, high-mix production test environment."

"Teradyne is pleased that as Toshiba prepares to test digital TV devices and the next wave of new electronic consumer products, they have selected the FLEX to test a spectrum of technologies," said Ted Quinn, FLEX Marketing Manager, Teradyne. "FLEX is a tool for increasing test capacity through multi-site concurrent test - ultimately lowering the cost to test new device technologies for Toshiba."

About FLEX

Changing the way IC makers and subcontract test companies think about the mix of equipment they need on their test floors, FLEX is a new high-volume, high-mix semiconductor test system spanning multi-site DFT to standard analog to SOC test. The FLEX integrates self-contained SOC Tester-Per-Pin(TM) instruments in a Universal Slot architecture that allows users to easily match system configuration to changing production needs for a wide range of devices. The independent TimeTracks(TM) architecture provides multiple clocks and sequencers per DUT socket, increasing the number of separate time domains from a few to dozens. Multi-level IG-XL5 system software gives test engineering the ability to mix fully graphic template programming, high level test procedures, and low level precision control. Utilizing portable test IP, FLEX can quickly go from single-site to multi-site test for fast production volume ramps. To learn more about FLEX, visit www.teradyne.com/integraflex.

About Teradyne

Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. Teradyne's test products are used by manufacturers of semiconductors, circuit assemblies, voice and broadband telephone networks. Teradyne's backplane assemblies and high-density connectors are used by manufacturers of communications and computing systems central to building networking infrastructure. The company had sales of $1.4 billion in 2001 and currently employs about 8000 people worldwide. For more information visit www.teradyne.com.

Time Tracks and SOC Tester Per Pin are trademarks of Teradyne.