Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

FLEX News Archive

 

2003

September 29, 2003
GuideTech Delivers New Instrument under Teradyne's Open Architecture Initiative; FEMTO instrumentation and FLEX test system combine for fully integrated test solution

April 1, 2003
Teradyne Introduces High Voltage Digital Option for Automotive/Power Devices; Automotive Device Test for ABS, Airbag or Engine Controller Units

January 28, 2003
Teradyne's FLEX Test System Awarded Test & Measurement World's 2003 Best in Test; SOC Test Per Pin Architecture Necessary for Emerging Devices