BOSTON--(BUSINESS WIRE)--March 11, 2004--Teradyne, Inc. (NYSE:TER) announced Xilinx (NASDAQ:XLNX) has purchased multiple FLEX test systems for next generation FPGA device test. Xilinx programmable logic devices are used in a wide array of applications ranging from wireless base stations to DVD players. Xilinx selected FLEX for functional digital test at 200+ MHz, very deep scan and 1GHz clocking capability. Built on a unique Universal Slot, "Tester-per-device-core"™ architecture, FLEX provides Xilinx twice the throughput of previous device test solutions.

"FLEX provides the capability to test our largest density devices that no other ATE vendor can match," said Jae Cho, Director of Advanced Products Test Engineering at Xilinx. "Very deep scan, high digital pin count and, most importantly, the PicoClock option address our Digital Clock Management testing and 3 to 10G SerDes production test. FLEX gives us greater confidence for all of our new FPGA devices."

"FLEX has proven itself to be a production platform that Xilinx can depend on," continued Mr. Cho. "We are testing all nine of our Virtex Pro family members on FLEX, and plan to use FLEX systems on our next generation Virtex 4 product family. The migration from J750 to FLEX has been a natural and easy process. Our test engineers are already familiar with the IG-XL operating system, and FLEX preserves our engineering test methods knowledge and provides more capability, both digital and analog."

"The latest family of Xilinx FPGA devices are indicative of a new wave of products coming to market with large pin counts, embedded microprocessor cores and multiple high speed ports," said Ted Quinn, FLEX Marketing Manager. "FLEX with PicoClock helps Xilinx qualify their advanced FPGA products and at the same time remain highly competitive in the cost sensitive consumer market."

About FLEX

Breaking the cost of test barrier with high-efficiency multi-site test while meeting the demands of increasing complexity for an expanding range of devices, FLEX advances multiple test technologies. FLEX spans test requirements from conventional DFT and structural test to standard analog and mixed-signal to complex SoC. Its Tester-per-device-core architecture delivers a complete set of test resources to each device core, with instrument synchronization and control in device clock time on a vector-by-vector basis. The Universal Slot test head and high-density instrumentation allow easy reconfiguration to changing test needs, and the OpenFLEX open system architecture complements Teradyne's FLEX instrument suite, allowing the addition of focused instruments to further enhance system performance and test economics. To learn more about FLEX, visit http://www.teradyne.com/flex/.

About Xilinx

Headquartered in San Jose, California, Xilinx is a publicly traded company (NASDAQ: XLNX) with approximately 2,600 employees. Revenue for the latest fiscal year ending March 31, 2003, was $1.16 billion. Market researcher Gartner Dataquest currently ranks Xilinx as the fourth largest supplier of applications specific integrated circuits (ASICs) in the world - up from fifth last year. Xilinx is the leading supplier of complete programmable logic solutions, including advanced integrated circuits, software design tools, predefined system functions delivered as cores, and unparalleled field engineering support.

About Teradyne

Teradyne (NYSE:TER) is the world's largest supplier of Automatic Test Equipment, and a leading supplier of interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2003, Teradyne had sales of $1.4 billion, and currently employs about 6100 people worldwide. For more information, visit www.teradyne.com. Teradyne is a trademark of Teradyne, Inc. in the US and other countries.

Tester-per-device-core is a trademark of Teradyne. Other brands or product names are trademarks or registered trademarks of their respective owners.