Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

FLEX News Archive

 

2004

December 08, 2004
KYEC Purchases Multiple Teradyne Handler Interface Board Changers

November 10, 2004
UTAC Tests Next-Generation Broadband Devices with New Turbo AC Instrument from Teradyne

November 04, 2004
Infiniti Solutions Ltd Expands Device Test Range with Teradyne's FLEX

October 18, 2004
STATS ChipPAC Signs Volume Purchase Agreement with Teradyne for FLEX Test Systems

July 09, 2004
Sigurd Expands Customer Base by Switching to Teradyne's FLEX

July 09, 2004
KYEC Purchases Multiple Teradyne FLEX Systems for Use in Multi-Site Wafer Probe

April 27, 2004
Microchip Technology Recognizes Teradyne with 2003 Supplier of the Year Award

April 15, 2004
Unisem Expands its Worldwide Mixed Signal/Rf Test Business with Teradyne

April 8, 2004
SAMSUNG Selects Teradyne’s FLEX as Next Generation Test System

March 11, 2004
Xilinx Purchases Multiple Teradyne FLEX Systems for Advanced FPGA Device Test

January 21, 2004
Intersil and ChipPAC Deploy Teradyne's FLEX Test System