Test Products
NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne Inc. (NYSE:TER) announced an agreement with Salland Engineering to include a basic version of the SEDana(TM) Statistical Data Analysis tool with the Teradyne IG-XL(TM) software operating system environment. The addition of the SEDana tool provides users with a familiar, industry-proven test data analysis tool, further extending the capability of IG-XL software.
“We chose to include Salland’s basic SEDana analysis tool in IG-XL to benefit our customers,” said John Arena, IG-XL Marketing Manager, Teradyne. “Including one of the industry’s latest data consolidation and analysis tools helps improve time-to-market and time-to-yield. SEDana receives high marks from our customers and has been used for several years by Teradyne’s Test Assistance Group (TAG).”
The SEDana tool is a window into the manufacturing process. It provides a comprehensive suite of data analysis functions to assist test, product, and design engineers in evaluating device test response under varying conditions. This analysis enables optimal determination of test limits, device specifications, and product/process modifications to maximize production test yields and minimize test application development time.
The basic version of the SEDana tool, SEDana Lite, is anticipated to be integrated into additional releases of IG-XL software for the FLEX(TM) Test Platform and the J750 Test System. Customers can purchase the full release by contacting Teradyne or Salland Engineering. The full release provides advanced statistical analysis, gage repeatability and reproducibility (to quantify error in measurement systems), scripting, and full report generation capabilities.
“Salland has worked hard to develop SEDana as a first class solution and we are pleased to have SEDana technology included with Teradyne IG-XL software.” said Paul van Ulsen, Salland Engineering Managing Director, CEO. “We have applied considerable resources to create a solution that makes test data analysis easy and efficient. By identifying market requirements and combining our experience in semiconductor test, we have developed an excellent data analysis tool.”
For more information on Teradyne’s Semiconductor Test Division products, visit their website at www.teradyne.com/std.
About the J750
The Teradyne J750 high-throughput parallel test capability provides high multi-site test efficiency in a zero-footprint "tester in a test head" system that delivers up to 1,024 I/O channels. The J750 offers a suite of options, including the Converter Test Option, Memory Test Option, Redundancy Analysis, and Mixed Signal Option that broaden the range of test capabilities. The system also features IG-XL(TM) test software that combines the power and performance of the latest PC technology and Windows operating system with the familiarity of standard Windows(R) productivity tools, such as Microsoft Excel and Visual Basic(R). The J750's small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.
About FLEX
The Teradyne FLEX Test Platform advances test technologies in a test architecture designed for high efficiency, multi-site test. The Platform offers multiple systems so customers can optimize for performance, capacity and capital cost to achieve lower cost-of-test. FLEX Platform systems span test requirements from DFT and structural test to standard analog and mixed-signal to the latest high-integration System-on-a-Chip (SoC) and System-In-Package (SiP) devices for consumer, automotive, mass storage, wireless, and data communications applications. The FLEX Platform architecture delivers instrument synchronization and control in device clock time on a vector-by-vector basis, even in multiple time domains. A Universal Slot test head design allows easy reconfiguration for changing test needs. The IG-XL software operating system provides fast program development, including instant conversion from single to multi-site test. And, the OpenFLEX(TM) open system architecture complements the FLEX Platform’s broad set of high-density instrumentation, allowing focused instruments to be added and further enhance system performance and test economics. To learn more about the FLEX Platform, visit www.teradyne.com/flex.
About SEDana
Salland Engineering’s SEDana data analysis tool has been developed using real world application experience instead of development from ‘behind the desk.’ In addition to standard statistical analysis tools, SEDana offers advanced practical features – including filtering, test-mapping, scaling, and more – all designed to maximize the efficiency of the test data analysis process. Salland Engineering also offers Basic and Advanced Data Analysis training for SEDana.
About Salland Engineering (Europe)
Established in 1992, Salland Engineering is a world leader in Test Application Support, Data Analysis, and ATE products, tools, and solutions. Working closely with customers and ATE manufacturers, Salland Engineering has delivered over 700 turnkey test applications and over 4000 products and solutions, including the worlds’ highest channel density integrated test instruments for modern open architecture ATE. To learn more about Salland, visit www.salland.com.
About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2005, Teradyne had sales of $1.08 billion, and currently employs about 4,000 people worldwide. For more information, visit www.teradyne.com.
Teradyne(R), FLEX, OpenFLEX, and IG-XL are trademarks or registered trademarks of Teradyne, Inc. in the US and other countries. SEDana is a trademark of Salland Engineering.
