Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Registration Opens for 2007 Teradyne Users Group Conference

ATE industry's longest running users group technical conference

24th Teradyne Users Group Technical Conference


NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne (NYSE:TER) announced the 24th Teradyne Users Group (TUG) Technical Conference will be held April 23-25, 2007 at the Sheraton Universal Hotel in Hollywood, California. TUG is the test industry's largest and longest running customer user group conference. Technical papers at TUG 2007 will cover a range of test topics, including instrument calibration, characterization, test efficiency, data analysis, test development and debug, and test time reduction.

A new addition at the 2007 TUG Conference is the Sunday Seminar series. The 2-3 hour long educational seminars will be held on Sunday, April 22, 2007, the day before the technical conference begins. Seminars will include a POP Workshop looking at techniques for Pattern Oriented Programming with IG-XL for Teradynes FLEX Test Platform, and an Introduction to VLSI Testing and Design Testability covering algorithms and techniques that are implemented in various EDA tools.

This years Semiconductor Program is a full 3 days, and the Mil/Aero Program will run for 2 days. Various companies providing products and services that interface with Teradyne systems will again exhibit at a vendor fair session during the conference and share their information with attendees.

Every year, the Teradyne Users Group conference hosts engineers from around the world who share the latest approaches and techniques to testing, and 2007 is no exception, said Kevin Walt, Senior Test Engineer, Broadcom and TUG 2007 Chair. This years program is packed with useful, educational topics on the test equipment that we use daily and provides everyone the opportunity to discuss the latest issues with Teradyne engineers and your peers. I encourage you to attend.

The TUG 2007 program is now available at the TUG web site where customers can review the technical program and register for the conference on line. Special TUG rates at the Sheraton Universal Hotel are available until March 30, 2007 and special TUG pre-registration discounts are available on-line until April 19, 2007. Registration for the Sunday Seminars is open until April 13, 2007. To learn more about TUG and to register for this year's exciting conference, visit the TUG web site at http://www.teradyne.com/tug

About TUG

The Teradyne Users Group (TUG) was started in 1983 by Teradyne customers. The event is open to all licensed users of Teradyne's test systems and software products and is held each year at rotating locations within the U.S. The conference consists of technical papers, poster sessions and tutorials that present the latest in test technology. TUG is managed by an annually elected steering committee of Teradyne users and Teradyne appointed delegates.

About Teradyne

Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics for the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2006, Teradyne had sales of $1.38 billion, and currently employs about 3,800 people worldwide. For more information, visit http://www.teradyne.com. Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.