TOKYO – November 19, 2007 – Teradyne Japan (NYSE:TER) hosted the eighth annual Teradyne Technical Seminar in Tokyo on November 9. This opportunity to share technical knowledge and exchange ideas related to the world of semiconductor test attracted over 150 test system users and engineers from leading semiconductor companies in Japan. The program featured 24 technical sessions and a keynote presentation by Mr. Hiroshi Asakura, editor-in-chief, Nikkei Microdevices magazine.

The conference’s technical sessions covered testing for Automotive & Microcontroller Devices, Test Trends, Unique Solutions, Imager, Digital Consumer and Testing Support. The session tracks were chaired by managers from major semiconductor companies in Japan – Asahi Kasei EMD, NEC Electronics, Renesas, Sony, TI/Japan and Toshiba.

In his address, Mr. Asakura focused on the most recent trends in LSI, MEMS, and flat panel display device segments and what Japan businesses need to do to excel. He suggested a shift in strategy towards focusing on a few key segments, rather than looking to make everything. ”The market has become more global, and cost competitiveness has become more and more critical for companies to survive,” said Mr. Asakura. “In such a competitive environment, companies are forced to focus on a few segments where they can be experts and invest in the segments they have chosen.”

Teradyne systems provide test solutions across the broadest range of market segments including computing, consumer electronics, mobile communications, home entertainment, automotive and power management, image processing, and microcontroller devices, covering test for established and new technologies. Teradyne’s worldwide installed base includes over 1400 FLEX(TM) platform test systems and almost 2500 J750 platform test systems, including the largest installed base of image sensor device test systems in the world with the IP750. Focusing on providing high efficiency test in production, Teradyne gives customers the lowest cost of test for a competitive advantage.

About Teradyne Japan
With the goal to provide the best customer service, Teradyne Japan (Teradyne K.K.) was established in 1978. It provides the IP750 image sensor test system family, and sales and service for Teradyne semiconductor test systems including the J750 and the FLEX(TM) Test Platform. Sales and support offices are located in Tokyo and Osaka. Design engineering, manufacturing, and product marketing is located at the facility in Kumamoto, Kyushu Island. Products designed in Kumamoto are distributed both in Japan and to customers worldwide. For more information in Japanese, visit www.teradyne.co.jp. 

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics for the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2006, Teradyne had sales of $1.38 billion, and currently employs about 3,600 people worldwide. For more information, visit www.teradyne.com. Teradyne ® is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.

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