Teradyne announced a new generation image sensor test system, IP750

Teradyne Receives Orders for More than 30 Systems.

Semicon Japan, Dec. 6, 2000. Teradyne's Japan Division (JD) has officially announced today the IP750, a new generation image sensor test system, at the Semicon Japan '2000 held at the Makuhari Messe, Chiba, Japan. The IP750 is parallel-testing CCD and CMOS image sensor devices at the show (Booth# B705, Hall 9). Mr. Oishi, JD's image sensor test system product manager, says that JD has already gotten more than 30 system orders from multiple customers both domestic and overseas.

The IP750 is a new generation image sensor tester based on Teradyne's J750 VLSI test system, which has the 100MHz digital tester functionalities, and added the state-of-art hardware and software architecture that answer the needs for testing CCD/CMOS image sensor devices, which requires complex functional testing.

The IP750 incorporates the Windows NT based IG-XL as the test development environment, which allows users for quick test program development and maintenance. Furthermore, the IP750 features the unique Integrated Parallel (IP) architecture, where complete parallel processing features are built in several different architecture levels, in both hardware and software. The IP architecture for example includes the DSP (Digital Signal Processing) functions of image data, which runs on the PC under multi-processor, multi-threaded program execution environment.

The IP750 is a highly integrated tester, which puts power of a complete100MHz digital tester and image sensor tester into the same space previously required for just the test head. The industry-first zero-footprint design allows for maximum use of the test floor space. Teradyne also provides integration supports for handler, prober and illuminator, not only for tester when a customor installs the IP750, therefore the customer can make sure that the system will be integrated into the test process quickly and smoothly.

Teradyne's Japan Division has the world-largest shipment volume and numbers of installed bases in the image sensor device test market in the world. The IP750 has been designed and developed by the Japan Division. In image sensor testing, test engineers face a set of test techniques and know-hows which is totally different from other semiconductor test techniques and know-hows. The Japan Division has more than 15 years of experience in this area, therefore is able to provide a total support by experienced engineering staffs, toward the volume production of the customer's new devices.

About Teradyne

Teradyne is the world's leading automated testing company for the electronics, communications, and software industries. Its products and services address the test requirements of a broad range of semiconductors, electronic assemblies, telephone access networks and software applications. Teradyne is also a leading supplier of backplane and interconnect systems for the electronics and communications industries. Teradyne systems are supported by several hundred service and applications engineers from Teradyne support centers located all over the world. Headquartered in Boston, Massachusetts, Teradyne had 1999 sales of $1.8 billion and currently employs about 8500 people worldwide. Its stock is listed on the New York Stock Exchange under the symbol TER. Teradyne's World Wide Web address is www.teradyne.com.

In Japan, Teradyne's sales/support offices are located at Tokyo and Osaka. The Japan Division is located at Kumamoto, Kyushu island, and is developing and manufacturing test systems not only for Japanese but also for world-wide test market.

Teradyne's Web site is http://www.teradyne.com (English), or http://www.teradyne.co.jp (Japanese).