Teradyne Introduces a New CMOS Image Sensor Test System, IP750E, for Cellularphone's Camera Module

CHIBA, Japan--(BUSINESS WIRE)--Dec. 5, 2001--Teradyne's Japan Division (JD) has officially unveiled the IP750E, a CMOS image sensor test system, at Semicon Japan 2001, being held at Makuhari Messe, Chiba, Japan. The IP750E is demonstrating parallel testing of CMOS image sensor devices at the show in Booth # B701, Hall 9.

Cellular phones with CMOS camera modules have been introduced to the market this year, and CMOS image sensor device prices need to be competitive, driving the need for low production cost. The CMOS image sensor device market is expected to accelerate in 2002 and to boom by 2005. Teradyne has focused on CMOS image sensor testing and developed the IP750E to help reduce test cost. "We are pleased to provide the IP750E, a low-cost tester with parallel test capability and simplified testing functions", said Hidenori Oishi, Image Sensor Marketing Manager at Teradyne Japan Division.

The IP750E sets 25 MHz as both the basic measurement frequency and data capture rate, and is equipped with optimized testing functions. The IP750E enables capture of both analog and digital data and parallel measurement of up to 4 devices. The IP750E can be upgraded to the IP750 by adding options to test CCD devices and High-end CMOS image sensor devices.

The IP750E features a unique Integrated Parallel (IP) architecture with complete parallel processing built in at several different architecture levels, in both hardware and software. The IP architecture includes Digital Signal Processing (DSP) of image data, which runs on the PC under a multi-processor, multi-threaded program execution environment. In addition, the IP750E incorporates the Windows NT(R)-based IG-XL(TM) software test development environment, which speeds test program development and maintenance.

A highly integrated tester, the IP750E puts the power of a complete 100MHz digital tester and image sensor tester into the space of a single test head. The industry's first zero-footprint system design allows for maximum use of test floor space. To ensure rapid project development to be ready for production testing, Teradyne provides total integration support for handler, prober and illuminator.

Teradyne's Japan Division (JD) has the world's largest shipment volume and installed base in the image sensor device test market. Image sensor testing requires a set of test techniques and know-how, which is completely different from other semiconductor test techniques. The Japan Division has more than fifteen years of experience in this area, and because of its experienced engineering staff JD can provide total support for the volume production of the customer's new devices.

About Teradyne

Teradyne (NYSE:TER) is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. Teradyne's test products are used by manufacturers of semiconductors, circuit assemblies and voice and broadband telephone networks. Teradyne's backplane assemblies and high-density connectors are used by manufacturers of communications and computing systems central to building networking infrastructure. The company had sales of $3 billion in 2000 and currently employs about 8000 people worldwide. For more information visit www.teradyne.com.

IG-XL is a trademark of Teradyne, Inc.