Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

IP750

2005

May 11, 2005
Global Testing Selects Teradyne IP750EP Image Sensor Test System for Silicon Valley Installation

 

2004

December 02, 2004
Teradyne Introduces the IP750EP for High-Speed Test of Image Sensor Devices

July 13, 2004
Foveon Selects Teradyne IP750 for Testing Award-Winning X3 Direct Image Sensor

2003

September 15, 2003
Taiwan's Largest Test House, King Yuan Electronics Co., LTD Purchases Multiple Teradyne IP750 Image Sensor Test Systems

 

2001

December 05, 2001
SANYO Selects Teradyne's IP750 as CCD Image Sensor Test System

December 05, 2001
Teradyne Introduces a New CMOS Image Sensor Test System, IP750E, for Cellularphone's Camera Module

December 05, 2001
Samsung Electro-Mechanics Selects Teradyne's Image Sensor Test System IP750

April 6, 2001
Teradyne Sells its First IP750 Image Sensor Test System in Europe to Silicon Vision AG

December 6, 2000
Teradyne announced a new generation image sensor test system, IP750

 

 

 

 

 

 

 

 

 

 

IP750 Test System PhotoTotal CCD/CMOS Image Sensor Test Solution