MUNICH, Germany--(BUSINESS WIRE)--April 24, 2001--Teradyne announced today that it has shipped the 750th J750 test system to Philips Semiconductors, Inc., the leading innovator of audio, video and communications ICs. Philips Semiconductors purchased several 1024/512 pin systems from Teradyne's Integra Test Division, for testing microcontroller devices for smartcard applications. Several systems were delivered in Q42000 and Q12001 to Philips Semiconductor's Hamburg, Germany facility. The 750th J750 has shipped to the same location. Teradyne will present a commemorative plaque to Harald Weinschenk, Test Operations Manager at Philips Semiconductors Hamburg, in the Teradyne Booth (Booth A1.224) at the Semicon Europa tradeshow, where the J750 is being demonstrated daily.

Doug Elder, Marketing Manager for Teradyne's Integra Test Division, said, "The need for a tester specific to the low-end logic market which includes smartcards and microcontrollers, has fueled the surge for the J750. The system's integrated architecture, system instrumentation options as well as the high parallel test efficiency has allowed the product to address other semiconductor markets like smartcards, FPGAs, PLDs, ASSP's/ASICs and baseband mixed signal."

Doug also said, "We are pleased that Philips Semiconductors has chosen the J750 as one of their ATE platforms for smartcard device testing. We offer a complete and economical test solution for testing smartcard devices more accurately and efficiently. The J750 is able to provide high performance throughput testing to meet the economics required to help keep Philips Semiconductors as the world leader in ICs for high-volume consumer, personal computing and communications applications. We're excited to be shipping the 750th J750 and look forward to continuing our long term partnership with Philips Semiconductors."

Harald Weinschenk, Test Operations Manager at Philips Semiconductors in Hamburg, Germany, said, "Our goal is to continuously reduce the cost-of-test with the highest throughput flexibility. In a market segment with exploding growth rates, this goal can only be achieved with leading test technology and industrialization. The technology innovation of the J750 and Teradyne's strong application support, will help us develop stable test applications with the highest yields."

About the J750

The INTEGRA J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system offers a suite of options to address the variation of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option, Scan Test Option, RFID Option, Redundancy Analysis and APMU.

The system also features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About Teradyne

Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and high performance interconnection systems for the electronics, telecommunications and Internet industries. In 2000, the company had sales of $3.0 billion with a year-end headcount exceeding 10,000 employees. Teradyne products are used to test semiconductors, circuit assemblies, telephone lines and broadband networks. Teradyne's backplane assemblies and high-density connectors are used in the communications and computing systems central to the Internet infrastructure. More than 70% of the company's business is driven by Internet growth.