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eSilicon Corporation Specifies Teradyne's J750 for Testing of New ASIC Device SAN JOSE, Calif.--(BUSINESS WIRE)--July 18, 2001--Teradyne announced today that eSilicon Corporation of Santa Clara, CA has specified the J750 as the test system of choice for production verification of its new ASIC to be used for an advanced consumer electronics application. eSilicon is a fabless supplier of application-specific integrated circuits (ASICs) to the world's leading electronics companies. Testing of the device will use the J750's broad test capability, including memory, converter, PLL locking, and parametric and functional scan test. "The J750 is a key part of our overall manufacturing strategy," said Gina Gloski, Vice President and General Manager of Worldwide Manufacturing Operations at eSilicon. "Teradyne was able to deliver the most economical and versatile test solution for our ASICs. It's the right solution for eSilicon today and will help us meet our customer's technical roadmap." Doug Elder, Teradyne J750 Marketing Manager, said, "The J750 with its low cost and extraordinary productivity is ideal for eSilicon's ASIC production verification. With over 175 J750 test systems installed at subcon fabless customers worldwide, the J750 is a production-proven test solution delivering the best test economics with the highest throughput and over 95% parallel test efficiency. I am confident that eSilicon is well positioned to supply their customers with complete custom chip implementation using the J750." J750 Family of Test Systems The J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option, Scan Test Option, RFID Option, Redundancy Analysis and APMU. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells. The system also features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. About eSilicon eSilicon Corporation is a full-service provider of integrated circuits (ICs) to the world's leading electronics companies. Founded in 1999, the company's unique approach manages every step of the IC development process - from specification through manufacturing and delivery of packaged and tested parts. eSilicon offers value-added design and manufacturing expertise, with an ebusiness infrastructure that provides significant visibility, predictability and time-to-market advantages. Headquartered in Santa Clara, CA with offices in Allentown, PA, and Bedminster, NJ, eSilicon has approximately 70 employees. For more information about eSilicon, visit www.eSilicon.com. eSilicon and the eSilicon logo are trademarks of eSilicon Corporation. About Teradyne Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is a leading supplier of high performance interconnection systems for the electronics, telecommunications and networking industries. The company had sales of $3 billion in 2000 and currently employs about 9200 people worldwide. Teradyne products are used to test semiconductors, circuit assemblies, telephone lines and broadband networks. Teradyne's backplane assemblies and high-density connectors are used in the communications and computing systems central to the Internet infrastructure. For more information visit www.teradyne.com.
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