BEDFORD, Mass.--(BUSINESS WIRE)--Oct. 8, 2001--Teradyne announced today that SanDisk, the world's leading supplier of flash data storage products, has purchased several J750 test systems. The systems will be used for probe and final testing of SanDisk's microcontrollers that integrate with their flash memory data storage products used in a wide variety of electronic systems. The systems are now installed at United Test Center, Inc. (UTC), SanDisk's semiconductor manufacturing partner in Taiwan.

"We have a strong partnership with Teradyne because we both strive to meet the time-to-market, product flexibility and cost needs of our customers," said Nelson Chan, Senior Vice President and General Manager of SanDisk's Retail Business Unit. "Based on the experience of working with both Teradyne and UTC, I am confident that together they can support our current and future testing needs guaranteeing capacity and faster time-to-market for our next-generation products."

Charles Lin, Vice President, Logic Testing Division at UTC, said, "Selecting the J750 ensures quality tested devices at the lowest overall cost of test. We are extremely impressed with the J750's full memory test capabilities demonstrating high throughput and parallel test efficiency, as well as Teradyne's experience and global support for its products."

Doug Elder, Teradyne's J750 Worldwide Marketing and Support Manager, said, "We are very pleased with this order from SanDisk since they are the world leader in the data storage device market. The J750 provides SanDisk with superior throughput and outstanding test economics, enabling them to offer customers a high quality flash storage solution."

J750 Family of Test Systems

The J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option, Scan Test Option, RFID Option, Redundancy Analysis and APMU. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

The system also features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic.

About SanDisk

SanDisk Corporation, the world's largest supplier of flash data storage products, designs, manufactures and markets industry-standard, solid-state data, digital imaging and audio storage products using its patented, high density flash memory and controller technology. SanDisk is based in Sunnyvale, CA.

About UTC

UTC was founded in 1995 and is a provider of semiconductor packaging and test services. With over 700 employees, the company offers a complete set of semiconductor services including wafer probe testing and IC packaging assembly and design. The company headquarters is located in Hsinchu, Taiwan, with a US office in Fremont, CA.

About Teradyne

Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is a leading supplier of high performance interconnection systems for the electronics, telecommunications and networking industries. The company had sales of $3 billion in 2000 and currently employs about 8000 people worldwide. Teradyne products are used to test semiconductors, circuit assemblies, telephone lines and broadband networks. Teradyne's backplane assemblies and high-density connectors are used in the communications and computing systems central to the Internet infrastructure. For more information visit www.teradyne.com.