SEOUL, Korea--(BUSINESS WIRE)--March 27, 2002--Teradyne (NYSE:TER) announced today that ITEST, Ltd., a recently formed test services provider, has purchased two Integra J750 test system as their first non-memory testers.

Delivered to the ITEST facility in Ichon, Korea, in January and March 2002, both Integra J750s include the Mixed Signal Option (MSO) and are testing audio codec devices. With high accuracy, low distortion, and excellent base instrument performance, Teradyne's Integra J750 provides an affordable mixed-signal test solution, outperforming other platforms in terms of test time and test performance.

Mr. Miles A. Prim, CEO and President, ITEST, Ltd., said, "We have selected Teradyne's Integra J750 as our initial mixed signal tester because its higher throughput and greater functionality provide the best test economics, well-aligning ITEST with customer requirements. The Integra J750 Mixed Signal Option performs beyond our current requirements, testing above 100dB SNR performance at the 20kHz bandwidth. As ITEST continues to develop and increase its role in the dynamic world of semiconductor test, we look forward to a growing relationship with Teradyne."

"Since its opening in August 2001, ITEST has been comparing several test systems to support their business. Teradyne is very pleased that the Integra J750 has been chosen as the ITEST inaugural mixed signal test system," said Roger Saylor, Teradyne Vice President of Asian Operations. "The Integra J750 has consistently demonstrated superior economics in a wide variety of market segments ranging from low-end smartcard to mixed-signal microcontrollers. We see a rapidly increasing non-memory test market in Korea, and we look forward to an expansion of our relationship with ITEST to serve this market."

About Integra J750

The Integra J750's high-throughput parallel test capability provides as high as 95% parallel test efficiency for up to 32 devices. The zero footprint system delivers up to 1024 I/O channels contained in a test head, and offers a suite of options, including the Converter Test Option, Memory Test Option, Redundancy Analysis, RFID (Radio Frequency Identification), Mixed Signal Option, and Analog Pin Measurement Unit - to address a range of testing needs. The system also features IG-XL test software, combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. The J750's small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About ITEST, Ltd.

ITEST is the first totally independent semiconductor testing service provider in Korea. ITEST provides full service test solutions to the semiconductor industry including wafer probe, final test and semiconductor test related engineering services. ITEST was established in August 2001 with Morgan Stanley, a leading private equal partner and two other Korean shareholders. ITEST currently serves mixed signal and memory customers and is decisively pursuing other technology sectors. For more information, contact ITEST via email to itest@itestsem.com.

About Teradyne

Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. Teradyne's test products are used by manufacturers of semiconductors, circuit assemblies, voice and broadband telephone networks. Teradyne's backplane assemblies and high-density connectors are used by manufacturers of communications and computing systems central to building networking infrastructure. The company had sales of $1.4 billion in 2001 and currently employs about 8000 people worldwide. For more information visit www.teradyne.com.