BOSTON--(BUSINESS WIRE)--June 25, 2002--Teradyne (NYSE:TER) today introduced the Integra J750 Enhanced Digital Channel Board, a new version of the Integra J750 digital channel board, which provides 325ps edge placement accuracy. The yield improvement and increase in device specifications of the Enhanced Digital Channel Board result in significant cost savings for Integra J750 customers. With over 800 Integra J750s shipped to customers worldwide, Teradyne continues to make the J750 a leading edge, low cost tester that keeps pace with today's complex devices.

"The Integra J750's low cost of test is now extended to devices that require better accuracy of 325 pico seconds," said Doug Elder, Consumer Business Unit Manager, Teradyne. "Since 500 pico seconds is insufficient to test some devices that are otherwise a good fit for the J750, better edge placement with the Enhanced Digital Channel Board will allow the Integra J750 to test a wider array of devices. Teradyne is constantly driving to bring the latest technology to our customers. This newest option is just one example of the many options, tools, and upgrades that are available, making the Integra J750 a flexible test solution with the lowest overall cost of test."

"The current semiconductor industry trend is towards increasing data rates for many devices. As the speed of a chip increases, the accuracy requirements for determining propagation delays and other measurements increase as well," remarked Dennis Keogh, Consumer Business Unit Product Manager. "The new Integra J750 Enhanced Digital Channel Board is the ideal tool for testing microcontollers, baseband controllers, and FPGAs of up to 100 MHz or more when used with the 200MHz Clock Module. Current J750 users can extend capability and accuracy at a low cost by upgrading their existing systems. New customers can take advantage of the many improvements made to the Integra J750 including the increased accuracy of the Enhanced Digital Channel Board with a simple digital upgrade."

Teradyne has developed a series of options, tools, and upgrades to the Integra J750 that include enhanced power supplies for greater mixed-signal testing capacity, the 200 MHz Clock Module, numerous device-specific options such as the MSO and RFID options, and iCell, the first turnkey, integrated test solution that addresses the entire test cell from tester to handler to software to support. These test solutions extend the tester capability of the Integra J750 while maintaining the overall lowest cost of test in the industry today.

About Integra J750

The Integra J750's high-throughput parallel test capability provides as high as 95% parallel test efficiency for up to 32 devices. The zero footprint system delivers up to 1024 I/O channels contained in a test head, and offers a suite of options, including the Converter Test Option, Memory Test Option, Redundancy Analysis, RFID (Radio Frequency Identification), Mixed Signal Option, and Analog Pin Measurement Unit - to address a range of testing needs. The system also features IG-XL test software, combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. The J750's small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About Teradyne

Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. Teradyne's test products are used by manufacturers of semiconductors, circuit assemblies, voice and broadband telephone networks. Teradyne's backplane assemblies and high-density connectors are used by manufacturers of communications and computing systems central to building networking infrastructure. The company had sales of $1.4 billion in 2001 and currently employs about 8000 people worldwide. For more information visit www.teradyne.com.