SHANGHAI, China--(BUSINESS WIRE)--Aug. 26, 2003--Teradyne (NYSE:TER) announced today that C* Core Technology Company (CTC), a collaboration between the China Ministry of Information and Motorola, has selected Teradyne's J750 for embedded processor device test. C*Core designs and licenses high performance 32-bit RISC C*Core™ embedded processors, based on Motorola's M*Core technology. In April 2003, C*Core Technology formed the C*Core Alliance in which more than sixty companies, including Teradyne, pledged to promote the development of China's high performance embedded and SOC design technology based on C*Core™. C*Core's selection of Teradyne's J750 in the competitive process was based on its combined digital test, scan test, memory test, and converter test capability while delivering the best test economics and highest parallelism.

" We are extremely pleased with the J750's superior performance while testing the first generation of our new embedded processor," said Mr. KeLu Hua, General Manager, C*Core Technology Company. "In addition to aligning with our device roadmap, the J750 exceeded our expectations for a superior tester at a low cost, while the strong local customer support in China makes us confident to continue testing new generation devices with Teradyne."

"Teradyne China is a recent member of the C*Core Industry Alliance organized by C*Core," said Hock Chiang, Managing Director, Teradyne Semiconductor Test Operations in China. "The goal of the C*Core Industry Alliance is to accelerate product development and maximize resources of alliance members. As Teradyne China continues to expand its presence and infrastructure, we are pleased to be a member of the Alliance and provide C*Core and its users with world-class testing solutions."

About J750

The J750's high-throughput parallel test capability provides as high as 95% parallel test efficiency for up to 32 devices. The zero footprint system delivers up to 1024 I/O channels contained in a test head, and offers a suite of options, including the Converter Test Option, Memory Test Option, Redundancy Analysis, RFID (Radio Frequency Identification), Mixed Signal Option, and Analog Pin Measurement Unit - to address a range of testing needs. The system also features IG-XL test software, combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. The J750's small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About C*Core Technology Co., Ltd.

C*Core Technology Company (CTC) is the result of collaboration between China Ministry of Information Industry (MII) and Motorola. CTC accepted the technology transfer from Motorola on M*Core, a 32-bit RISC embedded microprocessor and System-on-a-Chip (SoC) design methodology. Furthermore, CTC has enhanced the transferred technology and built a commercially licensable 32-bit embedded microprocessor, C*Core™ and SoC platform, C*SOC.

CTC's mission is to promote a licensable C*Core and C*SOC design platform. Also, CTC provides design service and turn-key silicon solutions to enable China companies to design advanced IC products. C*Core has a wide range of applications including industrial process control, portable devices, communications and networking, and consumer products, etc.

About Teradyne

Teradyne (NYSE:TER) is the world's largest supplier of Automatic Test Equipment, and a leading supplier of interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2002, Teradyne had sales of $1.22 billion, and currently employs about 6800 people worldwide. For more information, visit www.teradyne.com.