Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Beijing Huada Orders Additional Teradyne J750 Systems for RFID Smart Card Testing

SHANGHAI, China--(BUSINESS WIRE)--March 14, 2005--Teradyne, Inc. (NYSE:TER) announced that Beijing Huada, a leading VLSI testing service and solution provider for Beijing and Northern China, has purchased multiple J750 test systems to meet production capacity for RFID smart card testing. Competing against two other major test equipment manufacturers, the J750 was selected for its highly integrated, low-cost testing along with the powerful performance needed for RF smart cards.

"Given our long history of using Teradyne products, we feel that the selection of the J750 represents a type of milestone," noted Xiao Gang, General Manager of Beijing Huada. "Thanks to both the quality of the products and Teradyne's record of outstanding service and support, we anticipate great success in the RFID smart card market."

That history with Teradyne goes back to 1999, when Beijing Huada's parent company, CIDC, ordered its first two J750 systems, and then, five years later, opted for another J750 that they used primarily for RFID smart card projects.

"Teradyne is pleased that Beijing Huada has continued our business relationship. The J750 provides a productive test platform with highly parallel, low cost test for their demanding market," said SI Wei, Manager, Teradyne Semiconductor Test Field Operations, Greater China Region.

About J750

The J750's high-throughput parallel test capability provides as high as 95% efficiency. The zero footprint system delivers up to 1,024 I/O channels contained in a test head, and offers a suite of options, including the Converter Test Option, Memory Test Option, Redundancy Analysis, and Mixed Signal Option, that broaden the range of testing capabilities. The system also features IG-XL test software that combines the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, such as Microsoft Excel and Visual Basic. The J750's small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About Beijing Huada Test Company

Beijing Huada is one of the major professional VLSI Testing Service and Solution providers in China, offering device engineering, validation, and program conversion services, through capable, knowledgeable engineers with years of experience. For more information, visit: http://www.cidc.com.cn/doce/xsqy.htm.

About Teradyne

Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment and interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2004, Teradyne had sales of $1.8 billion, and currently employs about 5900 people worldwide. For more information, visit www.teradyne.com. Teradyne(R) is a registered trademark of Teradyne, Inc. in the US and other countries. All product names are trademarks or registered trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.