Test Products
SEMICON China 2007
NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne, Inc. (NYSE: TER), a world leader in high efficiency, low-cost test, will exhibit for the seventh consecutive year at SEMICON China. The conference, held in Shanghai, China at the Shanghai New International Expo Center (SNIEC) on March 21 – 23, 2007, is the longest established tradeshow in China dedicated to semiconductor manufacturing. Teradyne’s SEMICON China theme, “Consistent Quality, Economical Solutions,” reinforces why customers count on Teradyne –accurate, repeatable measurements while addressing the cost of test needs that are so important to device manufacturers and test contractors.
Teradyne will have the first showing of the J750Ex™, the new 200 MHz test configuration from the highly acclaimed J750 test system family. Also highlighted will be Teradyne’s UltraFLEX™ Test System for high efficiency multisite test of today’s high performance devices.
The J750 platform revolutionized ATE with its economical parallel testing and compact “tester-in-a-test-head” design. Approaching 2500 systems installed worldwide, the J750 is one of the most successful platforms in ATE history. The new J750Ex delivers the next generation of low cost test – with higher speed, deeper memory, and up to 99% parallel efficiency in a fully compatible system. Current J750 systems can be easily upgraded to the new configuration.
Demonstrations on the J750Ex include high efficiency, multisite testing of multimedia processors used in PC and cell phone cameras, and CCD and CMOS portable products. Visitors will also see quad-site test of a high resolution audio CODEC, highlighting the J750Ex’s cost efficiency, mixed signal capability and compatibility with the current J750 systems.
The UltraFLEX test system is designed for today's complex mixed-signal, system-on-a-chip (SoC), and system-in-package (SiP) devices. With over 2200 digital pins at Gigahertz speeds and a full suite of analog instrumentation, UltraFLEX can test a wide range of device technologies, including digital, analog, DC, RF and memory, while delivering nearly 100% test efficiency even in parallel test environments for optimum throughput and cost of test.
Demonstrations on the UltraFLEX include multisite test of controllers and chipsets. The demos will showcase the UltraFLEX SB6G instrument which provides functional test of high speed serial bus interfaces including PCI Express and Serial ATA.
“Teradyne continues to show its commitment to the growing China market. This is the seventh consecutive year we have exhibited at SEMICON China, and are very excited to unveil our newest test system, the J750Ex at the show,” stated SI Wei, Vice President, Semiconductor Test Field Operations, Greater China Region, Teradyne. “We look to continue providing our customers with the newest technology and best test solutions to help enhance their success.”
For more information about Teradyne at SEMICON China, please visit our web site http://www.teradyne.com/semichina/index.html (English version) or http://www.teradyne.com/semichina/index_chinese.html (Chinese version).
About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics for the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2006, Teradyne had sales of $1.38 billion, and currently employs about 3,800 people worldwide. For more information, visit www.teradyne.com. Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.
