2010 |2009 |2008 |2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001
2010
March 16, 2010
Teradyne Ships 3000th J750 Family System to Ardentec
February 24, 2010
ABOV Semiconductor Purchases J750 for Microcontroller Testing
2009
2008
October 28, 2008
Teradyne and Teseda Providing Time-to-Market and Yield Enhancement Solutions for the UltraFLEX and J750 Test Platforms
May 11, 2008
Teradyne's J750 Selected as a Standard System for Testing Renesas Technology Corp. Microcontroller
March 17, 2008
Teradyne Showcases J750Ex and Magnum EV at SEMICON China
March 17, 2008
Amlogic Specifies the Teradyne J750Ex for Audio-Video Processor Device Test
2007
July 8 , 2007
Microchip Technology Selects Teradyne as Microcontroller Test Supplier
March 19, 2007
Teradyne Showcases J750Ex and UltraFLEX at SEMICON China
March 18, 2007
Teradyne Introduces the J750Ex: the Next-Generation of Low-Cost Test
2006
September 26 , 2006
National IC Design Industrialization Base, Hangzhou
Purchases the Teradyne J750
July 24, 2006
Vimicro Orders Multiple Teradyne J750 Test Systems; Major semiconductor fabless company in China
March 19, 2006
Actions Semiconductor Purchases Teradyne J750 Test Systems for Consumer Device Test
2005
December 7, 2005
Teradyne's J750 Adopted by NEC Electronics for Microcontroller Device Test
October 11, 2005
Teradyne Celebrates Chung Yuan Christian University’s 50-Year Anniversary
March 14, 2005
Beijing Huada Orders Additional Teradyne J750 Systems for RFID Smart Card Testing
March 14, 2005
Actions Semiconductor Orders Multiple Teradyne J750 Systems for Audio IC Testing
2004
October 13, 2004
SensorDynamics Chooses Teradyne Test Equipment for Industrializing Complex Automotive Microsensor Systems
July 14, 2004
Teradyne's J750 Chosen By Marvell As Wafer Sort Test Platform
April 27, 2004
Microchip Technology Recognizes Teradyne with 2003 Supplier of the Year Award
April 19, 2004
Teradyne Collaborates with Amideon Systems for Entry into Russian Market
March 17, 2004
AIC Microsystems Selects Teradyne for Next-Generation Audio DAC Test
March 15, 2004
Vimicro Selects Teradyne's J750 with the Mixed-Signal Option for New Audio Processor Device Test
2003
August
26, 2003
C*Core Selects Teradyne for Testing Its Next Generation Embedded Processor
May
12, 2003
Samsung
Selects Teradyne
for Smart Card Test
April
21, 2003
UTAC Teams with Teradyne on Worldwide Semiconductor Industrial Training and Engineering
Center -SITEC- Initiative
March 13, 2003
Vimicro Selects Teradyne for Testing Its Next Generation Digital Image Processor;
J750 Chosen for Verification and Production Test at ASAT
March 12, 2003
Teradyne Wins Competitive Microcontroller Design-In at Haier;
One of the Biggest Home Appliance Manufacturers in the World
March
7, 2003
Teradyne Demonstrates Test Solutions for Emerging Technologies at SEMICON China
March 6, 2003
Teradyne Tests Amlogic's Latest DVD Device; Next-Generation
Device for DVD Players
February 20, 2003
UTAC Selects Teradyne's J750 Mixed Signal Option; Widens Range of Low-Cost
Test for Consumer ICs
2002
Dec. 9, 2002
Giesecke & Devrient Selects Teradyne's J750k for Design Verification and Qualification
of Smart Cards; Open Software Concept Of IG-XL Provides Optimal Support for Design
Verification
Sept. 16, 2002
SigmaTel Selects Teradyne Integra J750 Test System for Testing of PC Audio
Codecs
July 19, 2002
Microchip Technology Selects New iCell Integrated Production Test Cell Solution
Developed by Teradyne and Delta Design
June 25, 2002
Teradyne Improves Integra J750 Accuracy with New Enhanced Digital Channel Board
May 30, 2002
Shanghai Hua Hong Chooses Teradyne's Integra J750 for Smartcard Test
April 15, 2002
Teradyne's Integra J750k Targets Design Verification
March 27, 2002
ITEST, Ltd. Purchases Two Teradyne Integra J750s As First Mixed Signal Test
System
2001
Nov. 5, 2001
BridgePoint Technical Manufacturing Purchases J750 1024-pin Test System
Oct. 8, 2001
SanDisk Purchases Multiple J750 Test Systems from Teradyne
Sept.
17, 2001
Metalink Selects the J750 Test System from Teradyne
Sept. 17,
2001
eMicro Corporation Qualifies the J750 Test System for Testing of PC Audio Devices
Aug. 29, 2001
High Bandwidth Access Selects Teradyne Test Systems; Catalyst Tiger and J750
to Test Highest Value, Most Integrated FIFO Queuing Devices on The Market
Today
Aug. 23, 2001
Teradyne Introduces New On-line Software Licensing Tool; IG-XL License Express
Available to J750 Test System Customers
July
18, 2001
eSilicon Corporation Specifies Teradyne's J750 for Testing of New ASIC Device
July
18, 2001
Aeroflex UTMC Selects Catalyst Tiger and J750k Test Systems from Teradyne
July 18, 2001
GuideTech Femto 2000 Brings High Performance Time Measurement Capability to
the J750 Family of Test Systems
June 26, 2001
Teradyne Receives Outstanding Supplier Award from Microchip Technology
June 12, 2001
Teradyne Partners with E&M Engineering to Provide J750 Test Programming Services
to Fabless Market
April
24, 2001
Teradyne Ships the 750th J750 to Philips Semiconductors
April 24, 2001
Teradyne Introduces New Analog Instrumentation for High Parallel Mixed-Signal
Testing on the J750 Test System
April 23, 2001
Teradyne Announces Multiple System Order from NEC Electron Devices; NEC Electron
Devices Selects the J750 Test System
March 8, 2001
Signia Technologies Selects INTEGRA J750 and Catalyst Test Systems from Teradyne
for Baseband and Bluetooth Production Testing
Test Products