December 5, 2001
Teradyne Introduces a New CMOS Image Sensor Test System, IP750E, for Cellularphone's Camera Module
December 5, 2001
SANYO
Selects Teradyne's IP750 as CCD Image Sensor Test System
November 26, 2001
Resonext
Communications Selects Teradyne's Catalyst with MicroWAVE6000;
RF SOC Test Suite Speeds the Innovative 5GHz WLAN Devices
to Market
November 7, 2001
Teradyne
Number One in Customer Satisfaction in Memory Test;
Results of VLSI Research 2001 Survey
November 5, 2001
BridgePoint
Technical Manufacturing Purchases J750 1024-pin Test
System
October 30, 2001
Valence
Semiconductor Selects Teradyne for GPS and 802.11a WLAN
Testing; Leader in Mixed-Signal Communications uses
Catalyst with MicroWAVE6000
October 29, 2001
Teradyne
Introduces 3.2 Gbps SerDes Port Qualifier for Catalyst
Tiger
October 29, 2001
Teradyne
and Synopsys Collaborate to Deliver Full Benefits of
Design-for-Testability -DFT- Techniques
October 29, 2001
Teradyne
Focuses on Value Driven Test Performance at ITC; Performance
to Test Leading Edge Devices, Because Technology Never
Stops
October 29, 2001
Teradyne
Introduces Silicon Signals Software for VX Test Simulation;
Compares DUT Simulation with Actual Silicon Waveforms
to Improve Product Development Process
October 29, 2001
Teradyne
and Mentor Graphics Partner to Bridge the Design-to-Manufacturing
Test Gap
October 8, 2001
SANYO
Selects Teradyne's Catalyst as First SOC Test System
October 8, 2001
SanDisk
Purchases Multiple J750 Test Systems from Teradyne
September 17, 2001
eMicro
Corporation Qualifies the J750 Test System for Testing
of PC Audio Devices
September 17, 2001
Metalink
Selects the J750 Test System from Teradyne
August 29, 2001
High
Bandwidth Access Selects Teradyne Test Systems; Catalyst
Tiger and J750 to Test Highest Value, Most Integrated
FIFO Queuing Devices on The Market Today
August 23, 2001
Teradyne
Introduces New On-line Software Licensing Tool; IG-XL
License Express Available to J750 Test System Customers
August 20, 2001
Applied
Micro Circuits Corporation Selects Teradyne's Tiger;
Meeting Next Generation IC Test Requirements, Today
July 23, 2001
ISE
Labs Teams Up with Teradyne to Provide Engineering and
Production Services on Tiger Test Systems; Prepares
to Test Tomorrow's High-Performance Devices
July 18, 2001
GuideTech
Femto 2000 Brings High Performance Time Measurement
Capability to the J750 Family of Test Systems
July 18, 2001
Aeroflex
UTMC Selects Catalyst Tiger and J750k Test Systems from
Teradyne
July 18, 2001
Teradyne
Demonstrates New Full Differential Digital on Tiger;
Performance Economics for Emerging Technologies
July 18, 2001
Teradyne's
Catalyst Family Broadens Lead in Wireless Data Markets;
Industry Leading SOC Test Family Will Demonstrate New
Customer Support Capabilities
July 18, 2001
eSilicon
Corporation Specifies Teradyne's J750 for Testing of
New ASIC Device
July 13, 2001
API
NetWorks Selects Teradyne's Tiger to Test HyperTransport
-TM- Technology Devices
July 13, 2001
Hynix
Semiconductor and Teradyne Demonstrate 125 MHz DRAM
Wafer Test for Bare Die; Wafer to Package Correlation
Paves Way for New DRAM Applications
July 12, 2001
Teradyne
Expands New Test Solutions Because Technology Never
Stops; Showcasing at SEMICON West new test advancements
accelerating technology for a wide range of markets
July 12, 2001
Transilica
Selects Teradyne's Catalyst With MicroWAVE6000 to Test
Wireless SOC Solutions
July 11, 2001
UTAC
Places Order for Multiple Teradyne Tiger Test Systems;
Subcontractors Prepare to Test Tomorrow's High-Performance
Devices With Tiger
June 28, 2001
SiRF
GPS Chipset Ramps into High Volume on Teradyne's Catalyst
with MicroWAVE6000
June 26, 2001
Teradyne
Receives Outstanding Supplier Award from Microchip Technology
June 21, 2001
Agere
Systems Selects New Teradyne Tiger
June 13, 2001
Teradyne's
Catalyst Test System with MicroWAVE6000 Selected by
Atheros Communications; Emerging Leader in Wireless
LAN Market to Test New 802.11a Devices
June 12, 2001
Teradyne
Partners with E&M Engineering to Provide J750 Test Programming
Services to Fabless Market
June 12, 2001
AMD
Purchases Tiger Test Systems for Next Generation Devices
with HyperTransport Technology
May 16, 2001
AMD
Selects Teradyne's J973EP to Test Products with Next-Generation
HyperTransport Interconnect Technology
May 9, 2001
Teradyne's
VX Test Simulation Software Chosen by National Semiconductor
May 7, 2001
Mellanox
Technologies Selects Teradyne's Tiger to Test Its Multi-Gigabit
InfiniBand Devices
April 24, 2001
Teradyne
Introduces New Analog Instrumentation for High Parallel
Mixed-Signal Testing on the J750 Test System
April 24, 2001
Teradyne
Ships the 750th J750 to Philips Semiconductors
April 23, 2001
Teradyne
Announces Multiple System Order from NEC Electron Devices;
NEC Electron Devices Selects the J750 Test System
April 20, 2001
Atlantic
Technology, Ltd. Receives Its Fifth Teradyne Catalyst
RF Test System
April 19, 2001
Teradyne
Reduces Cost of Test with Next Generation High Performance
Analog Instrumentation; BBAC to be Demonstrated on Catalyst
at SEMICON Europa
April 19, 2001
ADVISORY/
Teradyne Demonstrates 200 MHz Clock Module on the J750
Test System at Semicon Europa
April 18, 2001
Teradyne's
J973EP Expands Performance for VLSI Test; Performance
And Flexibility Improve Test Economics For VLSI Producers
April 6, 2001
Test
Advantage Ltd. Selects Teradyne's Catalyst For Alba
Centre
April 6, 2001
Teradyne,
Inc. Corrects and Replaces Previous Announcement Issued
April 4, BW0659, MA-TERADYNE
April 6, 2001
Teradyne
Sells its First IP750 Image Sensor Test System in Europe
to Silicon Vision AG
April 4, 2001
Samsung
Electronics Selects Teradyne's Catalyst with MicroWAVE6000
Instrumentation; System to Test CDMA and Bluetooth Devices
April 4, 2001
Test
Advantage Ltd. Selects Teradyne's Catalyst For Alba
Centre; Center for Excellence in SOC Testing in Europe
to Utilize System For Training and Academic Research
March 20, 2001
Zeevo
Selects Teradyne's Catalyst with MicroWAVE6000; System
To Test Highest Value, Most Integrated Bluetooth Devices
On The Market Today
March 8, 2001
Signia
Technologies Selects INTEGRA J750 and Catalyst Test
Systems from Teradyne for Baseband and Bluetooth Production
Testing
February 14, 2001
DigitalVX
Plus Tiger Create Powerful New Test Solution; Teradyne
Combines Leading Simulation Software with Leading SOC
ATE
January 31, 2001
Teradyne
Demonstrates Leading-Edge Test Technologies at SEMICON
Korea; Enables Manufacturers to Increase Production
Volume and Reduce Test Costs and Cycle Times
January 31, 2001
Hyundai
Electronics Selects Teradyne's ARIES for Memory Device
Test; ARIES Provides Performance and Productivity to
Shorten Time to Market
January 31, 2001
Teradyne's
Versatile Catalyst Family Expands into Bluetooth and
VLSI Markets; The Leading SOC Tester is Showcased at
Semicon Korea
January 22, 2001
Teradyne
Tiger To Test ASE Test's SOC Devices; First SOC Test
System with Digital I/O over 1 Gigabit/sec to Provide
Enhanced Test Capacity to World's SOC Devices
January 18, 2001
Teradyne
Introduces the Probe-One Memory Test System with More
Than $15 Million in Orders; First ATE System Designed
for High-Parallel DRAM Wafer Probing
Test Products