Teradyne Semiconductor Test - News Archive 2002

Test Products Contact Information Support Sales Test Cell Products Outsourcing Test About Semiconductor Test Advanced Search \| Site Map Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.			Home > News Archive 2002 2010 \| 2009 \| 2008 \| 2007 \| 2006 \| 2005 \| 2004 \| 2003 \| 2002 \| 2001 2002 December 16, 2002 Teradyne's Tiger Selected for National Semiconductor's Next-Generation SOC Device Test December 9, 2002 Giesecke & Devrient Selects Teradyne's J750k for Design Verification and Qualification of Smart Cards; Open Software Concept Of IG-XL Provides Optimal Support for Design Verification November 21, 2002 Agere Uses Teradyne's Tiger Test Systems for High-Performance Data Storage System-on-a-Chip Devices October 17, 2002 VIKO Technology Selects Teradyne's Catalyst for Wireless Test October 8, 2002 UTAC Orders Multiple Teradyne Catalyst Test Systems with MicroWAVE6000 For Mobile, Wireless and Broadband Applications October 7, 2002 Teradyne Awarded 2002 Test Solution Supplier of the Year by Magis September 24, 2002 Toshiba Selects Teradyne's Integra FLEX Test System; Toshiba to Use New Universal Slot Architecture for High-mix Consumer Device Test September 17, 2002 VIA Technologies Selects Teradyne's Tiger for Chipset Production Test; Rapid Time to Market and Superior Economics Driven by Improved Test Performance September 16, 2002 SigmaTel Selects Teradyne Integra J750 Test System for Testing of PC Audio Codecs September 16, 2002 Samsung Chooses Teradyne Tiger for High Speed/High Performance SOC Test July 26, 2002 Canada's First Test House, DA-Test, Selects Teradyne's Catalyst Featuring MicroWAVE6000; DA-Test provides leading SOC tester for the growing `Silicon Valley of the North' July 19, 2002 Teradyne's Integra FLEX Chosen as New Tester Platform for Microchip Technology; Universal Slot Architecture and IG-XL Software Enable Flexibility for Product Line Expansion July 17, 2002 Teradyne's Catalyst and Tiger Testers Certified Embedded Test Ready by LogicVision July 11, 2002 Teradyne Reduces Test Costs with Performance on Demand™ July 10, 2002 Teradyne Announces RF Micro Devices And STATS To Ramp Bluetooth Device Production On Teradyne's Catalyst Test Systems With MicroWAVE6000 June 25, 2002 Teradyne Improves Integra J750 Accuracy with New Enhanced Digital Channel Board June 10, 2002 MediaTek Specifies Teradyne Catalyst Test System May 30, 2002 Shanghai Hua Hong Chooses Teradyne's Integra J750 for Smartcard Test May 20, 2002 Teradyne Announces Open Architecture Initiative for the New Integra FLEX Test System May 1, 2002 Teradyne's New Integra FLEX Test System Selected as Next Generation Platform; Universal Slot Architecture Enables Manufacturing Flexibility for Range of Devices April 15, 2002 Teradyne's Integra J750k Targets Design Verification March 27, 2002 ITEST, Ltd. Purchases Two Teradyne Integra J750s As First Mixed Signal Test System March 20, 2002 Teradyne Introduces Integra FLEX; New Universal Slot Architecture Sets a New Standard for Semiconductor Test March 13, 2002 SPIL Chooses Teradyne's Tiger for Chipset Production Test; Subcontractors Prepare for Future Chipset Device Test With Tiger's Flexible Configuration February 19, 2002 Infineon Selects Teradyne's MicroWAVE6000 on Catalyst to Test Bluetooth Devices February 13, 2002 ASE Test Selects Teradyne's Tiger for Improved Test Economics; Improved Economics Driven by Improved Test Performance February 11, 2002 Teradyne Ships 1000th Catalyst to QUALCOMM January 31, 2002 Teradyne Introduces AWG LAN for the Catalyst and Tiger Test Systems