Teradyne Semiconductor Test - News Archive 2004

Test Products Contact Information Support Sales Test Cell Products Outsourcing Test About Semiconductor Test Advanced Search \| Site Map Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.			Home > News Archive 2004 2010 \| 2009 \| 2008 \| 2007 \| 2006 \| 2005 \| 2004 \| 2003 \| 2002 \| 2001 2004 December 08, 2004 KYEC Purchases Multiple Teradyne Handler Interface Board Changers December 02, 2004 Teradyne Introduces the IP750EP for High-Speed Test of Image Sensor Devices November 10, 2004 UTAC Tests Next-Generation Broadband Devices with New Turbo AC Instrument from Teradyne November 04, 2004 Infiniti Solutions Ltd Expands Device Test Range with Teradyne's FLEX October 18, 2004 STATS ChipPAC Signs Volume Purchase Agreement with Teradyne for FLEX Test Systems October 13, 2004 SensorDynamics Chooses Teradyne Test Equipment for Industrializing Complex Automotive Microsensor Systems July 14, 2004 Teradyne Places in '10 BEST' Suppliers for VLSI Research 2004 Survey July 14, 2004 Teradyne's J750 Chosen By Marvell As Wafer Sort Test Platform July 13, 2004 Foveon Selects Teradyne IP750 for Testing Award-Winning X3 Direct Image Sensor July 09, 2004 Sigurd Expands Customer Base by Switching to Teradyne's FLEX July 09, 2004 KYEC Purchases Multiple Teradyne FLEX Systems for Use in Multi-Site Wafer Probe May 17, 2004 Teradyne and ASE Announce Strategic Agreement Including Volume Purchase of Teradyne Test Systems April 27, 2004 Microchip Technology Recognizes Teradyne with 2003 Supplier of the Year Award April 19, 2004 Teradyne Collaborates with Amideon Systems for Entry into Russian Market April 15, 2004 Unisem Expands its Worldwide Mixed Signal/Rf Test Business with Teradyne April 8, 2004 SAMSUNG Selects Teradyne’s FLEX as Next Generation Test System March 17, 2004 AIC Microsystems Selects Teradyne for Next-Generation Audio DAC Test March 15, 2004 Vimicro Selects Teradyne's J750 with the Mixed-Signal Option for New Audio Processor Device Test March 12, 2004 Teradyne Establishes University Scholarship Program in China March 11, 2004 Xilinx Purchases Multiple Teradyne FLEX Systems for Advanced FPGA Device Test March 01, 2004 Fudan University Selects Teradyne's Catalyst for Mixed-Signal Design Verification and Volume Production January 21, 2004 Intersil and ChipPAC Deploy Teradyne's FLEX Test System January 8, 2004 Teradyne Selects Salland Engineering's SEDana Product as Standard Test Data Analysis Tool January 6, 2004 SAMSUNG Purchases Multiple Teradyne Tigers for Multi-Site Probe of Broadband Devices