Teradyne Semiconductor Test - News Archive 2006

Test Products Contact Information Support Sales Test Cell Products Outsourcing Test About Semiconductor Test Advanced Search \| Site Map Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.			Home > News Archive 2006 2010 \| 2009 \| 2008 \| 2007 \| 2006 \| 2005 \| 2004 \| 2003 \| 2002 \| 2001 2006 December 20 , 2006 Teradyne Receives Five Star Rating from VLSI Research December 14 , 2006 Teradyne Integrates SEDana(TM) Data Analysis Tool from Salland Engineering with IG-XL(TM) Software December 12 , 2006 Teradyne and LogicVision Integrate Silicon Diagnostic Solutions with the IG-XL(TM) Operating System December 6 , 2006 Staccato Communications Specifies Teradyne FLEX™ Test Platform for Production Ramp of Ripcord™ Products Based on Certified Wireless USB December 4 , 2006 Teradyne Sponsors 2006 FSA Awards Dinner Celebration November 29 , 2006 Agere Systems Honors Teradyne with 2006 Strategic Supplier Award November 27, 2006 Teradyne Japan Hosts Seventh Annual Technical Seminar October 24, 2006 Teradyne Delivers 1000th FLEX Test Platform System October 11, 2006 Teradyne Ships 150th Gen4 Microwave Option to AMI Semiconductor September 26 , 2006 National IC Design Industrialization Base, Hangzhou Purchases the Teradyne J750 July 24, 2006 Vimicro Orders Multiple Teradyne J750 Test Systems; Major semiconductor fabless company in China April 3, 2006 Teradyne's microFLEX Selected by Infineon Technologies as Exclusive Test System for Automotive Power ICs March 19, 2006 Teradyne's UltraFLEX Systems Selected by SMIC; A Leading Foundry in China March 19, 2006 ASAT Purchases Teradyne Test Systems for High Volume Mixed Signal Consumer Device Applications March 19, 2006 Actions Semiconductor Purchases Teradyne J750 Test Systems for Consumer Device Test March 2, 2006 Teradyne Integrates EDA Conversion Tools with FLEX Platform's IG-XL Software; Provides Free 15-Day Trial License for Test Insight Software Suite February 7, 2006 Teradyne microFLEX Selected to Test DVB-H Chipsets; Enabling mobile TV for cellphones