Teradyne Semiconductor Test - News Archive 2008

Test Products Contact Information Support Sales Test Cell Products Outsourcing Test About Semiconductor Test Advanced Search \| Site Map Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.			Home > News Archive 2008 2010 \| 2009 \| 2008 \| 2007 \| 2006 \| 2005 \| 2004 \| 2003 \| 2002 \| 2001 2008 December 10, 2008 Teradyne Sponsors GSA Awards Dinner December 8, 2008 More than 400 Participants Attend Teradyne's Device Test Seminars in Asia November 17, 2008 Teradyne Completes Acquisition of Eagle Test Systems, Inc. November 6, 2008 Teradyne and Mentor Graphics Partner to Provide Yield Learning Solution for Nanometer Geometry Devices Ooctober 28, 2008 Teradyne and Teseda Providing Time-to-Market and Yield Enhancement Solutions for the UltraFLEX and J750 Test Platforms October 28, 2008 Semiconductor Test Industry Leaders Unite Behind New Alliance to Foster Improved Industry Productivity September 25, 2008 Teradyne Users Group Announces 2009 Call for Papers July 28, 2008 Teradyne Introduces the IP750Ex for Image Sensor Device Test July 27, 2008 UTAC Selects Teradyne as the Platform of Choice for Leading Edge Wireless Device Test July 14, 2008 Teradyne Introduces Five New Products in Five Months July 10, 2008 Asahikasei EMD First to Select Teradyne's New UltraFLEX-HD Test Sytem with UltraPin800 and UltraWave12G Instrumentation Suite July 9, 2008 Teradyne Introduces the New UltraPin800 High Density Digital Instrument July 6, 2008 Teradyne Announces Magnum II with Increased Performance and Speed June 25, 2008 Customers Rate Teradyne First for Product Performance in VLSI Research "10 BEST" List May 20, 2008 Teradyne, Inc. Marks 35 Years in Japan; Headquarters Relocated to Minato Mirai, Yokohama May 18, 2008 Teradyne's Nextest Business Unit Ships 2,000th Tester May 11, 2008 Teradyne's J750 Selected as a Standard System for Testing Renesas Technology Corp. Microcontroller April 28, 2008 Teradyne Commemorates 25 Years of TUG with $25,000 in College Scholarships April 16, 2008 Teradyne's FLEX Platform Wins Automotive Device Test Evaluation at Bosch April 10, 2008 Teradyne Introduces D750Ex High Density LCD Driver Test System April 3, 2008 Teradyne Introduces Certification Program for Refurbished Test Equipment March 30, 2008 Teradyne Delivers 350th FLEX Gen4 Microwave Instrument to CSR March 25, 2008 Teradyne Users Group Conference Celebrates 25 Years March 19, 2008 Teradyne Introduces New UltraWave 12G Wireless Test Solution March 18 , 2008 Amlogic Specifies the Teradyne J750Ex for Audio-Video Processor Device Test March 18 , 2008 Teradyne Showcases J750Ex and Magnum EV at SEMICON China