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Outsourcing Test News Archive

2004 | 2003 | 2002 | 2001

  2004
 

October 18, 2004
STATS ChipPAC Signs Volume Purchase Agreement with Teradyne for FLEX Test Systems

July 09, 2004
Sigurd Expands Customer Base by Switching to Teradyne's FLEX

July 09, 2004
KYEC Purchases Multiple Teradyne FLEX Systems for Use in Multi-Site Wafer Probe

May 17, 2004
Teradyne and ASE Announce Strategic Agreement Including Volume Purchase of Teradyne Test Systems

January 21, 2004
Intersil and ChipPAC Deploy Teradyne's FLEX Test System

 
  2003
 

September 16, 2003
Airoha Technology Selects Teradyne's Catalyst for Wireless Device Test

September 15, 2003
Taiwan's Largest Test House, King Yuan Electronics Co., LTD Purchases Multiple Teradyne IP750 Image Sensor Test Systems

August 12, 2003
ULi Selects Teradyne's Tiger for Chipset Engineering and Production Test

July 14, 2003
ASAT Purchases Multiple Teradyne Catalyst Systems

July 10, 2003
ASET Invests in Multiple Teradyne Tiger SOC Test Systems for Next Generation Device Test

April 25, 2003
Global Advanced Packaging Technology -GAPT- Purchases Teradyne's Catalyst for a Range of Device Test

April 21, 2003
UTAC Teams with Teradyne on Worldwide Semiconductor Industrial Training and Engineering Center -SITEC- Initiative

April 14, 2003
ChipPAC Purchases Multiple Teradyne Catalyst Test Systems for Wireless Device Test

April 14, 2003
SPIL Orders Multiple Tiger Systems for Graphics Processor and Chipset Production; Tiger's Flexible Configurations and High Throughput Deliver Winning Economics

March 27, 2003
Semiconductor Manufacturing International Corporation Purchases Multiple Teradyne Logic and Mixed-Signal Test Systems

March 12, 2003
Global Advanced Packaging Technology -GAPT- Selects First Teradyne Tiger Test System in China

February 20, 2003
UTAC Selects Teradyne's J750 Mixed Signal Option; Widens Range of Low-Cost Test for Consumer ICs

 
  2002
 

October 8, 2002
UTAC Orders Multiple Teradyne Catalyst Test Systems with MicroWAVE6000 For Mobile, Wireless and Broadband Applications

July 26, 2002
Canada's First Test House, DA-Test, Selects Teradyne's Catalyst Featuring MicroWAVE6000; DA-Test provides leading SOC tester for the growing `Silicon Valley of the North'

July 10, 2002
Teradyne Announces RF Micro Devices And STATS To Ramp Bluetooth Device Production On Teradyne's Catalyst Test Systems With MicroWAVE6000

March 27, 2002
ITEST, Ltd. Purchases Two Teradyne Integra J750s As First Mixed Signal Test System

March 13, 2002
SPIL Chooses Teradyne's Tiger for Chipset Production Test; Subcontractors Prepare for Future Chipset Device Test With Tiger's Flexible Configuration

February 13, 2002
ASE Test Selects Teradyne's Tiger for Improved Test Economics; Improved Economics Driven by Improved Test Performance

 
  2001
 

November 5, 2001
BridgePoint Technical Manufacturing Purchases J750 1024-pin Test System

July 23, 2001
ISE Labs Teams Up with Teradyne to Provide Engineering and Production Services on Tiger Test Systems; Prepares to Test Tomorrow's High-Performance Devices

July 18, 2001
Aeroflex UTMC Selects Catalyst Tiger and J750k Test Systems from Teradyne

July 11, 2001
UTAC Places Order for Multiple Teradyne Tiger Test Systems; Subcontractors Prepare to Test Tomorrow's High-Performance Devices With Tiger

June 28, 2001
SiRF GPS Chipset Ramps into High Volume on Teradyne's Catalyst with MicroWAVE6000

April 20, 2001
Atlantic Technology, Ltd. Receives Its Fifth Teradyne Catalyst RF Test System

April 19, 2001
Teradyne Reduces Cost of Test with Next Generation High Performance Analog Instrumentation; BBAC to be Demonstrated on Catalyst at SEMICON Europa

January 22, 2001
Teradyne Tiger To Test ASE Test's SOC Devices; First SOC Test System with Digital I/O over 1 Gigabit/sec to Provide Enhanced Test Capacity to World's SOC Devices

   

 

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Outsourcing Test News:

bullet STATS ChipPAC Signs Volume Purchase Agreement with Teradyne for FLEX Test Systems

bullet Sigurd Expands Customer Base by Switching to Teradyne's FLEX

bullet KYEC Purchases Multiple Teradyne FLEX Systems for Use in Multi-Site Wafer Probe

bullet Archived News



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