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SAMSUNG Purchases Multiple Teradyne Tigers for Multi-Site Probe of Broadband Devices BOSTON, MASSACHUSETTS - January 6, 2004 - Teradyne, Inc. (NYSE:TER) announced Korea-based SAMSUNG Electronics Co. Ltd has purchased multiple Tiger test systems for multi-site probe of ICs used in several optical disk drive and baseband applications. The Tiger systems will be used for high throughput, multi-site wafer probe in SAMSUNG's Kihung, South Korean facility. The multi-million dollar order expands SAMSUNG's existing fleet of Teradyne products. The key to Tiger's success at SAMSUNG is its multi-site test capability combined with high performance instrumentation required for at-speed functional test. SAMSUNG will utilize Tiger's Broadband AC (BBAC) capability across its 15MHz bandwidth, the Source Synchronous Digital pins, the SerDes Port Qualifier, and Tiger's GigaDig option. This set of capability enables production test of embedded clock interfaces, DDR memory buses, and other high-speed applications, including those requiring precise jitter injection and measurement. "Tiger's unique combination of performance and high efficiency multi-site test enables SAMSUNG to test their most challenging devices with a dramatic reduction in cost of test," said Jeff Schneider, Strategic Marketing Manager, Teradyne . "The BBAC instrument provides wide bandwidth, low noise density, and faster test time for Samsung. The GigaDig precisely measures the jitter parameters, improving test quality, yield, and test cost. We're excited to be working closely with Samsung on the testing of their newest device technologies." About Tiger About SAMSUNG Electronics About Teradyne
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